Johannes Kindt

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Ettlingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for adaptive tracking using a scanning probe m...
- Patent number 9,075,080
- Issue date Jul 7, 2015
- Bruker Nano, Inc.
- Judith Mosley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cleaning station for atomic force microscope
- Patent number 8,782,811
- Issue date Jul 15, 2014
- Bruker Nano, Inc.
- Johannes H. Kindt
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with compact scanner
- Patent number 8,474,060
- Issue date Jun 25, 2013
- Bruker Nano, Inc.
- Nghi Phan
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR ADAPTIVE TRACKING USING A SCANNING PROBE M...
- Publication number 20140283227
- Publication date Sep 18, 2014
- Bruker Nano, Inc.
- Judith Mosley
- B82 - NANO-TECHNOLOGY
Information Patent Application
Cleaning Station for Atomic Force Microscope
- Publication number 20120297510
- Publication date Nov 22, 2012
- BRUKER NANO INC
- Johannes H. Kindt
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope with compact scanner
- Publication number 20120278957
- Publication date Nov 1, 2012
- Bruker Nano, Inc.
- Nghi Phan
- G01 - MEASURING TESTING