Johannes Kindt

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Goleta, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Fast-scanning SPM and method of operating same
- Patent number 7,770,231
- Issue date Aug 3, 2010
- Veeco Instruments, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Scanner for probe microscopy
- Patent number 7,555,941
- Issue date Jul 7, 2009
- The Regents of the University of California
- Paul K. Hansma
- G01 - MEASURING TESTING
Information Patent Grant
Scanner for probe microscopy
- Patent number 7,278,298
- Issue date Oct 9, 2007
- The Regents of the University of California
- Paul K. Hansma
- G01 - MEASURING TESTING
Information Patent Grant
Measurement head for atomic force microscopy and other applications
- Patent number 6,871,527
- Issue date Mar 29, 2005
- The Regents of the University of California
- Paul K. Hansma
- G01 - MEASURING TESTING
Information Patent Grant
Modular, energy-dissipating material and method for using it
- Patent number 6,376,636
- Issue date Apr 23, 2002
- The Regents of the University of California
- Paul K. Hansma
- B32 - LAYERED PRODUCTS

Patents Applicationslast 30 patents

Information Patent Application
Fast-Scanning SPM and Method of Operating Same
- Publication number 20090032706
- Publication date Feb 5, 2009
- Veeco Instruments Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Scanner for probe microscopy
- Publication number 20080078240
- Publication date Apr 3, 2008
- The Regents of the University of California.
- Paul K. Hansma
- G01 - MEASURING TESTING
Information Patent Application
Scanner for probe microscopy
- Publication number 20060112760
- Publication date Jun 1, 2006
- Paul K. Hansma
- G01 - MEASURING TESTING
Information Patent Application
Measurement head for atomic force microscopy and other applications
- Publication number 20030015653
- Publication date Jan 23, 2003
- Paul K. Hansma
- G01 - MEASURING TESTING