Johannes Maria Kuiper

Person

Koog aan de Zaan, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus for lithography
- Patent number 8,760,623
- Issue date Jun 24, 2014
- ASML Netherlands B.V.
- Johannes Maria Kuiper
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for vibration detection and vibration analysis...
- Patent number 7,773,235
- Issue date Aug 10, 2010
- ASML Netherlands B.V.
- Haico Victor Kok
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for vibration detection and vibration analysis...
- Patent number 7,409,302
- Issue date Aug 5, 2008
- ASML Netherlands B.V.
- Haico Victor Kok
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Inspection Method and Apparatus, and Lithographic Apparatus
- Publication number 20110208342
- Publication date Aug 25, 2011
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Apparatus for Lithography
- Publication number 20100302521
- Publication date Dec 2, 2010
- ASML Netherlands B.V.
- Johannes Maria Kuiper
- G02 - OPTICS
Information Patent Application
Passive reticle tool, a lithographic apparatus and a method of patt...
- Publication number 20100182582
- Publication date Jul 22, 2010
- ASML NETHERLANDS B.V,
- Marcus Adrianus Van De Kerkhof
- G01 - MEASURING TESTING
Information Patent Application
Lithographic projection system and projection lens polarization sensor
- Publication number 20100118288
- Publication date May 13, 2010
- Marcus Adrianus Van De Kerkhof
- G01 - MEASURING TESTING
Information Patent Application
Lithographic Apparatus, Method for Determining at Least One Polariz...
- Publication number 20100045956
- Publication date Feb 25, 2010
- ASML NETHERLANDS B.V.
- Marcus Adrianus Van De Kerkhof
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for vibration detection and vibration analysis...
- Publication number 20090051934
- Publication date Feb 26, 2009
- ASML NETHERLANDS B.V.
- Haico Victor Kok
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for vibration detection and vibration analysis...
- Publication number 20060061746
- Publication date Mar 23, 2006
- ASML NETHERLANDS B.V.
- Haico Victor Kok
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Johannes Maria Kuiper

Person

Patents Grantslast 30 patents

Inspection apparatus for lithography

Method and apparatus for vibration detection and vibration analysis...

Method and apparatus for vibration detection and vibration analysis...

Patents Applicationslast 30 patents

Inspection Method and Apparatus, and Lithographic Apparatus

Inspection Apparatus for Lithography

Passive reticle tool, a lithographic apparatus and a method of patt...

Lithographic projection system and projection lens polarization sensor

Lithographic Apparatus, Method for Determining at Least One Polariz...

Method and apparatus for vibration detection and vibration analysis...

Method and apparatus for vibration detection and vibration analysis...