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Johannes Matheus Marie DE WIT
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Helmond, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Variable corrector of a wave front
Patent number
10,852,247
Issue date
Dec 1, 2020
ASML Holding N.V.
Stanislav Smirnov
G01 - MEASURING TESTING
Information
Patent Grant
Beam homogenizer, illumination system and metrology system
Patent number
10,495,889
Issue date
Dec 3, 2019
ASML Netherlands B.V.
Markus Franciscus Antonius Eurlings
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Illumination system and metrology system
Patent number
10,416,567
Issue date
Sep 17, 2019
ASML Netherlands B.V.
Johannes Matheus Marie De Wit
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Radiation conditioning system, illumination system and metrology ap...
Patent number
10,303,064
Issue date
May 28, 2019
ASML Netherlands B.V.
Sebastianus Adrianus Goorden
G02 - OPTICS
Information
Patent Grant
Device and method for processing a radiation beam with coherence
Patent number
10,234,767
Issue date
Mar 19, 2019
ASML Netherlands B.V.
Sebastianus Adrianus Goorden
G02 - OPTICS
Information
Patent Grant
Photon source, metrology apparatus, lithographic system and device...
Patent number
9,357,626
Issue date
May 31, 2016
ASML Netherlands B.V.
Henricus Petrus Maria Pellemans
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Photon source, metrology apparatus, lithographic system and device...
Patent number
8,921,814
Issue date
Dec 30, 2014
ASML Netherlands B.V.
Henricus Petrus Maria Pellemans
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
Patent number
8,497,975
Issue date
Jul 30, 2013
ASML Netherlands B.V.
Johannes Matheus Marie De Wit
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
VARIABLE CORRECTOR OF A WAVE FRONT
Publication number
20180045657
Publication date
Feb 15, 2018
ASML Holding N.V.
Stanislav SMIRNOV
G01 - MEASURING TESTING
Information
Patent Application
Device and Method for Processing a Radiation Beam with Coherence
Publication number
20180031977
Publication date
Feb 1, 2018
ASML NETHERLANDS B.V.
Sebastianus Adrianus GOORDEN
G01 - MEASURING TESTING
Information
Patent Application
Radiation Conditioning System, Illumination System And Metrology Ap...
Publication number
20170329232
Publication date
Nov 16, 2017
ASM Netherlands B.V.
Sebastianus Adrianus GOORDEN
G01 - MEASURING TESTING
Information
Patent Application
Illumination System and Metrology System
Publication number
20170255105
Publication date
Sep 7, 2017
ASML NETHERLANDS B.V.
Johannes Matheus Marie DE WIT
G01 - MEASURING TESTING
Information
Patent Application
Beam Homogenizer, Illumination System and Metrology System
Publication number
20170248794
Publication date
Aug 31, 2017
ASML NETHERLANDS B.V.
Markus Franciscus Antonius EURLINGS
G02 - OPTICS
Information
Patent Application
Photon Source, Metrology Apparatus, Lithographic System and Device...
Publication number
20150108373
Publication date
Apr 23, 2015
ASML NETHERLANDS B.V.
Henricus Petrus Maria PELLEMANS
G01 - MEASURING TESTING
Information
Patent Application
Photon Source, Metrology Apparatus, Lithographic System and Device...
Publication number
20130329204
Publication date
Dec 12, 2013
Henricus Petrus Maria PELLEMANS
G01 - MEASURING TESTING
Information
Patent Application
Optical Device for Recording and Reproducing
Publication number
20080279081
Publication date
Nov 13, 2008
Arima Devices Corporation
Petrus Jutte
G11 - INFORMATION STORAGE