Johannes Mathias Theodorus Antonius Adriaens

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Mirror calibrating method, a position measuring method, a lithograp...
- Patent number 11,940,264
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Johannes Mathias Theodorus Antonius Adriaens
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position measurement system, interferometer system and lithographic...
- Patent number 11,619,886
- Issue date Apr 4, 2023
- ASML Netherlands B.V.
- Johannes Mathias Theodorus Antonius Adriaens
- G01 - MEASURING TESTING
Information Patent Grant
Substrate positioning system, lithographic apparatus and device man...
- Patent number 9,470,988
- Issue date Oct 18, 2016
- ASML Netherlands B.V.
- Engelbertus Antonius Fransiscus Van Der Pasch
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MIRROR CALIBRATING METHOD, A POSITION MEASURING METHOD, A LITHOGRAP...
- Publication number 20220357147
- Publication date Nov 10, 2022
- ASML NETHERLANDS B.V.
- Johannes Mathias Theodorus Antonius ADRIAENS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
POSITION MEASUREMENT SYSTEM, INTERFEROMETER SYSTEM AND LITHOGRAPHIC...
- Publication number 20200409274
- Publication date Dec 31, 2020
- AS ML NETHERLANDS B.V.
- Johannes Mathias Theodorus Antonius ADRIAENS
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE POSITIONING SYSTEM, LITHOGRAPHIC APPARATUS AND DEVICE MAN...
- Publication number 20150277242
- Publication date Oct 1, 2015
- ASML NETHERLANDS B.V.
- Engelbertus Antonius Fransiscus Van Der Pasch
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY