Johannes P. M. Van Alen

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Almelo, NL

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis apparatus and scanning unit suitable for use in such...
- Patent number 5,438,613
- Issue date Aug 1, 1995
- U.S. Philips Corporation
- Wilhelmus A. H. Gijzen
- G01 - MEASURING TESTING