John A. Geen

Person

Tewksbury, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Balanced runners synchronizing motion of masses in micromachined de...
- Patent number 10,697,774
- Issue date Jun 30, 2020
- Analog Devices, Inc.
- Igor P. Prikhodko
- G01 - MEASURING TESTING
Information Patent Grant
Synchronized mass gyroscope
- Patent number 10,415,968
- Issue date Sep 17, 2019
- Analog Devices, Inc.
- Igor P. Prikhodko
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of tungsten MEMS structures
- Patent number 9,878,901
- Issue date Jan 30, 2018
- Analog Devices, Inc.
- John A. Geen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and apparatus for detecting linear and rotational movement
- Patent number 9,709,595
- Issue date Jul 18, 2017
- Analog Devices, Inc.
- Gaurav Vohra
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscopes with reduced errors
- Patent number 9,212,908
- Issue date Dec 15, 2015
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Electrode arrangements for quadrature suppression in inertial sensors
- Patent number 9,207,081
- Issue date Dec 8, 2015
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for anchoring electrodes in MEMS devices
- Patent number 8,919,199
- Issue date Dec 30, 2014
- Analog Devices, Inc.
- Michael W. Judy
- G01 - MEASURING TESTING
Information Patent Grant
Non-degenerate mode MEMS gyroscope
- Patent number 8,794,068
- Issue date Aug 5, 2014
- Analog Devices, Inc.
- Michael W. Judy
- G01 - MEASURING TESTING
Information Patent Grant
Offset detection and compensation for micromachined inertial sensors
- Patent number 8,783,103
- Issue date Jul 22, 2014
- Analog Devices, Inc.
- William A. Clark
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for calibrating MEMS inertial sensors
- Patent number 8,701,459
- Issue date Apr 22, 2014
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Detection and mitigation of aerodynamic error sources for micromach...
- Patent number 8,677,801
- Issue date Mar 25, 2014
- Analog Devices, Inc.
- William A. Clark
- G01 - MEASURING TESTING
Information Patent Grant
Mode-matching apparatus and method for micromachined inertial sensors
- Patent number 8,616,055
- Issue date Dec 31, 2013
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Detection and mitigation of particle contaminants in MEMS devices
- Patent number 8,598,891
- Issue date Dec 3, 2013
- Analog Devices, Inc.
- Vineet Kumar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Piezoelectric transducers
- Patent number 8,555,718
- Issue date Oct 15, 2013
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Grant
Inertial sensors using piezoelectric transducers
- Patent number 8,549,918
- Issue date Oct 8, 2013
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Grant
Detection and mitigation of particle contaminants in MEMS devices
- Patent number 8,421,481
- Issue date Apr 16, 2013
- Analog Devices, Inc.
- Vineet Kumar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Piezoelectric transducers and inertial sensors using piezoelectric...
- Patent number 8,408,060
- Issue date Apr 2, 2013
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Grant
Inertial sensors with reduced sensitivity to quadrature errors and...
- Patent number 8,266,961
- Issue date Sep 18, 2012
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Grant
Mode-matching apparatus and method for micromachined inertial sensors
- Patent number 8,151,641
- Issue date Apr 10, 2012
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for a micromachined multisensor
- Patent number 7,980,133
- Issue date Jul 19, 2011
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Analog-to-digital converter using digital output as dither
- Patent number 7,956,783
- Issue date Jun 7, 2011
- Analog Devices, Inc.
- John A. Geen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Capped sensor
- Patent number 7,795,723
- Issue date Sep 14, 2010
- Analog Devices, Inc.
- Kevin H.-L. Chau
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Common centroid micromachine driver
- Patent number 7,478,557
- Issue date Jan 20, 2009
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Cross-quad and vertically coupled inertial sensors
- Patent number 7,421,897
- Issue date Sep 9, 2008
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Micromachined devices
- Patent number 7,406,866
- Issue date Aug 5, 2008
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Micromachined apparatus with co-linear drive arrays
- Patent number 7,357,025
- Issue date Apr 15, 2008
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Coupling apparatus for inertial sensors
- Patent number 7,347,094
- Issue date Mar 25, 2008
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Micromachined apparatus with split vibratory masses
- Patent number 7,216,539
- Issue date May 15, 2007
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Micromachined apparatus with drive/sensing fingers in coupling levers
- Patent number 7,204,144
- Issue date Apr 17, 2007
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Grant
Micromachined apparatus utilizing box suspensions
- Patent number 7,089,792
- Issue date Aug 15, 2006
- Analod Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BALANCED RUNNERS SYNCHRONIZING MOTION OF MASSES IN MICROMACHINED DE...
- Publication number 20180172445
- Publication date Jun 21, 2018
- Analog Devices, Inc.
- Igor P. Prikhodko
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONIZED MASS GYROSCOPE
- Publication number 20180172447
- Publication date Jun 21, 2018
- Analog Devices, Inc.
- Igor P. Prikhodko
- G01 - MEASURING TESTING
Information Patent Application
Fabrication of Tungsten MEMS Structures
- Publication number 20150336790
- Publication date Nov 26, 2015
- Analog Devices, Inc.
- John A. Geen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method and Apparatus for Detecting Linear and Rotational Movement
- Publication number 20150128701
- Publication date May 14, 2015
- Analog Devices, Inc.
- Gaurav Vohra
- G01 - MEASURING TESTING
Information Patent Application
Electrode Arrangements for Quadrature Suppression in Inertial Sensors
- Publication number 20140102195
- Publication date Apr 17, 2014
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Detection and Mitigation of Aerodynamic Error Sources for Micromach...
- Publication number 20140060186
- Publication date Mar 6, 2014
- Analog Devices, Inc.
- William A. Clark
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPES WITH REDUCED ERRORS
- Publication number 20130283908
- Publication date Oct 31, 2013
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Inertial Sensors Using Piezoelectric Transducers
- Publication number 20130167639
- Publication date Jul 4, 2013
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Application
Piezoelectric Transducers
- Publication number 20130167642
- Publication date Jul 4, 2013
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Application
Detection and Mitigation of Particle Contaminants in MEMS Devices
- Publication number 20130168675
- Publication date Jul 4, 2013
- Analog Devices, Inc.
- Vineet Kumar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Piezoelectric Transducers and Inertial Sensors using Piezoelectric...
- Publication number 20120210790
- Publication date Aug 23, 2012
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Application
Mode-Matching Apparatus and Method for Micromachined Inertial Sensors
- Publication number 20120192648
- Publication date Aug 2, 2012
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Anchoring Electrodes in MEMS Devices
- Publication number 20120137773
- Publication date Jun 7, 2012
- Analog Devices, Inc.
- Michael W. Judy
- G01 - MEASURING TESTING
Information Patent Application
Non-Degenerate Mode MEMS Gyroscope
- Publication number 20120137774
- Publication date Jun 7, 2012
- Analog Devices, Inc.
- Michael W. Judy
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Calibrating MEMS Inertial Sensors
- Publication number 20110167891
- Publication date Jul 14, 2011
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Detection and Mitigation of Particle Contaminants in MEMS Devices
- Publication number 20110115498
- Publication date May 19, 2011
- Analog Devices, Inc.
- Vineet Kumar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Offset Detection and Compensation for Micromachined Inertial Sensors
- Publication number 20110041609
- Publication date Feb 24, 2011
- Analog Devices, Inc.
- William A. Clark
- G01 - MEASURING TESTING
Information Patent Application
Inertial Sensors with Reduced Sensitivity to Quadrature Errors and...
- Publication number 20110030474
- Publication date Feb 10, 2011
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Application
Mode-Matching Apparatus and Method for Micromachined Inertial Sensors
- Publication number 20100294039
- Publication date Nov 25, 2010
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Analog-to-Digital Converter Using Digital Output as Dither
- Publication number 20100188274
- Publication date Jul 29, 2010
- Analog Devices, Inc.
- John A. Geen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Piezoelectric Transducers and Inertial Sensors using Piezoelectric...
- Publication number 20100058861
- Publication date Mar 11, 2010
- Analog Devices, Inc.
- Jinbo Kuang
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for a Micromachined Multisensor
- Publication number 20100043551
- Publication date Feb 25, 2010
- Analog Devices, Inc.
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Capacitive sensor with damping
- Publication number 20060266118
- Publication date Nov 30, 2006
- Timothy J. Denison
- G01 - MEASURING TESTING
Information Patent Application
Cross-quad and vertically coupled inertial sensors
- Publication number 20060230830
- Publication date Oct 19, 2006
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Micromachined apparatus with split vibratory masses
- Publication number 20060191340
- Publication date Aug 31, 2006
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Micromachined apparatus with drive/sensing fingers in coupling levers
- Publication number 20060191339
- Publication date Aug 31, 2006
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Micromachined apparatus with co-linear drive arrays
- Publication number 20060179945
- Publication date Aug 17, 2006
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Common centroid micromachine driver
- Publication number 20060144174
- Publication date Jul 6, 2006
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Micromachined devices
- Publication number 20050274182
- Publication date Dec 15, 2005
- Analog Devices
- John A. Geen
- G01 - MEASURING TESTING
Information Patent Application
Inertial sensor with a linear array of sensor elements
- Publication number 20050229705
- Publication date Oct 20, 2005
- John A. Geen
- G01 - MEASURING TESTING

John A. Geen

Person

Patents Grantslast 30 patents

Balanced runners synchronizing motion of masses in micromachined de...

Synchronized mass gyroscope

Fabrication of tungsten MEMS structures

Method and apparatus for detecting linear and rotational movement

MEMS gyroscopes with reduced errors

Electrode arrangements for quadrature suppression in inertial sensors

Apparatus and method for anchoring electrodes in MEMS devices

Non-degenerate mode MEMS gyroscope

Offset detection and compensation for micromachined inertial sensors

Apparatus and method for calibrating MEMS inertial sensors

Detection and mitigation of aerodynamic error sources for micromach...

Mode-matching apparatus and method for micromachined inertial sensors

Detection and mitigation of particle contaminants in MEMS devices

Piezoelectric transducers

Inertial sensors using piezoelectric transducers

Detection and mitigation of particle contaminants in MEMS devices

Piezoelectric transducers and inertial sensors using piezoelectric...

Inertial sensors with reduced sensitivity to quadrature errors and...

Mode-matching apparatus and method for micromachined inertial sensors

Method and apparatus for a micromachined multisensor

Analog-to-digital converter using digital output as dither

Capped sensor

Common centroid micromachine driver

Cross-quad and vertically coupled inertial sensors

Micromachined devices

Micromachined apparatus with co-linear drive arrays

Coupling apparatus for inertial sensors

Micromachined apparatus with split vibratory masses

Micromachined apparatus with drive/sensing fingers in coupling levers

Micromachined apparatus utilizing box suspensions

Patents Applicationslast 30 patents

BALANCED RUNNERS SYNCHRONIZING MOTION OF MASSES IN MICROMACHINED DE...

SYNCHRONIZED MASS GYROSCOPE

Fabrication of Tungsten MEMS Structures

Method and Apparatus for Detecting Linear and Rotational Movement

Electrode Arrangements for Quadrature Suppression in Inertial Sensors

Detection and Mitigation of Aerodynamic Error Sources for Micromach...

MEMS GYROSCOPES WITH REDUCED ERRORS

Inertial Sensors Using Piezoelectric Transducers

Piezoelectric Transducers

Detection and Mitigation of Particle Contaminants in MEMS Devices

Piezoelectric Transducers and Inertial Sensors using Piezoelectric...

Mode-Matching Apparatus and Method for Micromachined Inertial Sensors

Apparatus and Method for Anchoring Electrodes in MEMS Devices

Non-Degenerate Mode MEMS Gyroscope

Apparatus and Method for Calibrating MEMS Inertial Sensors

Detection and Mitigation of Particle Contaminants in MEMS Devices

Offset Detection and Compensation for Micromachined Inertial Sensors

Inertial Sensors with Reduced Sensitivity to Quadrature Errors and...

Mode-Matching Apparatus and Method for Micromachined Inertial Sensors

Analog-to-Digital Converter Using Digital Output as Dither

Piezoelectric Transducers and Inertial Sensors using Piezoelectric...

Method and Apparatus for a Micromachined Multisensor

Capacitive sensor with damping

Cross-quad and vertically coupled inertial sensors

Micromachined apparatus with split vibratory masses

Micromachined apparatus with drive/sensing fingers in coupling levers

Micromachined apparatus with co-linear drive arrays

Common centroid micromachine driver

Micromachined devices

Inertial sensor with a linear array of sensor elements