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John A. Gibbs
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Lynnwood, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Fractional-N frequency synthesizer with cascaded sigma-delta conver...
Patent number
7,024,171
Issue date
Apr 4, 2006
ICOM America, Incorporated
John Gibbs
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
On-board measurement system
Patent number
5,587,932
Issue date
Dec 24, 1996
Fluke Corporation
Joseph V. Ferrante
G01 - MEASURING TESTING
Information
Patent Grant
Swept signal analysis instrument and method
Patent number
5,420,514
Issue date
May 30, 1995
Hewlett-Packard Company
Jay M. Wardle
G01 - MEASURING TESTING
Information
Patent Grant
Swept signal analysis instrument and method
Patent number
5,300,878
Issue date
Apr 5, 1994
Hewlett-Packard Company
Jay M. Wardle
G01 - MEASURING TESTING
Information
Patent Grant
Swept signal analysis instrument and method
Patent number
5,168,213
Issue date
Dec 1, 1992
Hewlett-Packard Company
Jay M. Wardle
G01 - MEASURING TESTING
Information
Patent Grant
Swept signal analysis instrument and method
Patent number
5,117,179
Issue date
May 26, 1992
Hewlett-Packard Company
Jay M. Wardle
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Fractional-N frequency synthesizer with cascaded sigma-delta conver...
Publication number
20040164809
Publication date
Aug 26, 2004
ICOM America, Incorporated
John A. Gibbs
H03 - BASIC ELECTRONIC CIRCUITRY