John A. Gurley

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Feedback control for scanning tunnel microscopes
- Patent number RE37203
- Issue date Jun 5, 2001
- Digital Instruments, Inc.
- Virgil B. Elings
- 250 - Radiant energy
Information Patent Grant
Tapping atomic force microscope with phase or frequency detection
- Patent number RE36488
- Issue date Jan 11, 2000
- Veeco Instruments Inc.
- Virgil B. Elings
- 250 - Radiant energy
Information Patent Grant
Method and apparatus for obtaining improved vertical metrology meas...
- Patent number 5,898,106
- Issue date Apr 27, 1999
- Digital Instruments, Inc.
- Kenneth L. Babcock
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having automatic probe exchange and align...
- Patent number 5,705,814
- Issue date Jan 6, 1998
- Digital Instruments, Inc.
- James M. Young
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tapping atomic force microscope with phase or frequency detection
- Patent number 5,519,212
- Issue date May 21, 1996
- Digital Instruments, Incorporated
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope using stored data for vertical probe posi...
- Patent number 5,418,363
- Issue date May 23, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Jumping probe microscope
- Patent number 5,415,027
- Issue date May 16, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tapping atomic force microscope
- Patent number 5,412,980
- Issue date May 9, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,329,808
- Issue date Jul 19, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Stiffness enhancer for movable stage assembly
- Patent number 5,314,254
- Issue date May 24, 1994
- Digital Instruments
- Frank D. Yashar
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning probe microscope using stored data for vertical probe posi...
- Patent number 5,308,974
- Issue date May 3, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Positioning device for scanning probe microscopes
- Patent number 5,306,919
- Issue date Apr 26, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Jumping probe microscope
- Patent number 5,266,801
- Issue date Nov 30, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope for small samples having dual-mode operatin...
- Patent number 5,253,516
- Issue date Oct 19, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,237,859
- Issue date Aug 24, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Feedback control for scanning tunnel microscopes
- Patent number RE34331
- Issue date Aug 3, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- 250 - Radiant energy
Information Patent Grant
Jumping probe microscope
- Patent number 5,229,606
- Issue date Jul 20, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,224,376
- Issue date Jul 6, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of adjusting the size of the area scanned by a scanning probe
- Patent number 5,204,531
- Issue date Apr 20, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanner for scanning probe microscopes having reduced Z-axis non-li...
- Patent number 5,198,715
- Issue date Mar 30, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Compact atomic force microscope
- Patent number 5,189,906
- Issue date Mar 2, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Drift compensation for scanning probe microscopes using an enhanced...
- Patent number 5,077,473
- Issue date Dec 31, 1991
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscopes with correction for coupling effects
- Patent number 5,066,858
- Issue date Nov 19, 1991
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of driving a piezoelectric scanner linearly with time
- Patent number 5,051,646
- Issue date Sep 24, 1991
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Compact atomic force microscope
- Patent number 5,025,658
- Issue date Jun 25, 1991
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Feedback control for scanning tunnel microscopes
- Patent number 4,889,988
- Issue date Dec 26, 1989
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Positioning device for a scanning tunneling microscope
- Patent number 4,871,938
- Issue date Oct 3, 1989
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR IMPROVING A FLEXURE STAGE
- Publication number 20020005679
- Publication date Jan 17, 2002
- VIRGIL B. ELINGS
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

John A. Gurley

Person

Patents Grantslast 30 patents

Feedback control for scanning tunnel microscopes

Tapping atomic force microscope with phase or frequency detection

Method and apparatus for obtaining improved vertical metrology meas...

Scanning probe microscope having automatic probe exchange and align...

Tapping atomic force microscope with phase or frequency detection

Scanning probe microscope using stored data for vertical probe posi...

Jumping probe microscope

Tapping atomic force microscope

Atomic force microscope

Stiffness enhancer for movable stage assembly

Scanning probe microscope using stored data for vertical probe posi...

Positioning device for scanning probe microscopes

Jumping probe microscope

Atomic force microscope for small samples having dual-mode operatin...

Atomic force microscope

Feedback control for scanning tunnel microscopes

Jumping probe microscope

Atomic force microscope

Method of adjusting the size of the area scanned by a scanning probe

Scanner for scanning probe microscopes having reduced Z-axis non-li...

Compact atomic force microscope

Drift compensation for scanning probe microscopes using an enhanced...

Scanning tunneling microscopes with correction for coupling effects

Method of driving a piezoelectric scanner linearly with time

Compact atomic force microscope

Feedback control for scanning tunnel microscopes

Positioning device for a scanning tunneling microscope

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR IMPROVING A FLEXURE STAGE