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John A. Hewitson
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Valencia, CA, US
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last 30 patents
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Patent Grant
High resolution density measurement profiler using silicon photomul...
Patent number
9,274,247
Issue date
Mar 1, 2016
Ronan Engineering Company
John A. Hewitson
G01 - MEASURING TESTING
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Patent Grant
System to completely measure multiple densities at varying levels i...
Patent number
8,754,374
Issue date
Jun 17, 2014
Ronan Engineering Company
John A. Hewitson
G01 - MEASURING TESTING