John A. Knoch

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Troutdale, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer edge defect inspection using captured image analysis
- Patent number 7,968,859
- Issue date Jun 28, 2011
- LSI Corporation
- Roger Y. B. Young
- G01 - MEASURING TESTING
Information Patent Grant
Method of qualifying a process tool with wafer defect maps
- Patent number 7,079,966
- Issue date Jul 18, 2006
- LSI Logic Corporation
- John A. Knoch
- G01 - MEASURING TESTING
Information Patent Grant
Process control system
- Patent number 6,512,985
- Issue date Jan 28, 2003
- LSI Logic Corporation
- Bruce J. Whitefield
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Method of qualifying a process tool with wafer defect maps
- Publication number 20050065739
- Publication date Mar 24, 2005
- John A. Knoch
- G01 - MEASURING TESTING
Information Patent Application
Wafer edge defect inspection
- Publication number 20050023491
- Publication date Feb 3, 2005
- Roger Y. B. Young
- G01 - MEASURING TESTING