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John A. Orr
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Holden, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Precision location methods and systems
Patent number
8,928,459
Issue date
Jan 6, 2015
Worcester Polytechnic Institute
David Cyganski
G01 - MEASURING TESTING
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Patent Grant
Methods and apparatus for high resolution positioning
Patent number
7,292,189
Issue date
Nov 6, 2007
Worcester Polytechnic Institute
John A. Orr
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PRECISION LOCATION METHODS AND SYSTEMS
Publication number
20100277339
Publication date
Nov 4, 2010
Worcester Polytechnic Institute
David Cyganski
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for high resolution positioning
Publication number
20060244661
Publication date
Nov 2, 2006
Worcester Polytechnic Institute
John A. Orr
G01 - MEASURING TESTING