John A. Schultz

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Houston, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Inorganic nanoparticle matrices for sample analysis
- Patent number 10,191,028
- Issue date Jan 29, 2019
- Ionwerks
- John Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 7,019,286
- Issue date Mar 28, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Grant
Mobility spectrometer
- Patent number 6,897,437
- Issue date May 24, 2005
- Ionwerks
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 6,683,299
- Issue date Jan 27, 2004
- Ionwerks
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20040113064
- Publication date Jun 17, 2004
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20030001087
- Publication date Jan 2, 2003
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mobility spectrometer
- Publication number 20010032929
- Publication date Oct 25, 2001
- Katrin Fuhrer
- G01 - MEASURING TESTING