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John Allgair
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Tigard, OR, US
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last 30 patents
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Patent Grant
Interferometric characterization of surface topography
Patent number
10,488,184
Issue date
Nov 26, 2019
Nanometrics Incorporated
Kevin Eduard Heidrich
G06 - COMPUTING CALCULATING COUNTING
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last 30 patents
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Patent Application
INTERFEROMETRIC CHARACTERIZATION OF SURFACE TOPOGRAPHY
Publication number
20170016715
Publication date
Jan 19, 2017
Nanometrics Incorporated
Kevin Eduard HEIDRICH
G01 - MEASURING TESTING