John Anthony Notte

Person

Gloucester, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam system and methods
- Patent number 10,410,828
- Issue date Sep 10, 2019
- Carl Zeiss Microscopy, LLC
- Chuong Huynh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 10,354,830
- Issue date Jul 16, 2019
- Carl Zeiss Microscopy, LLC
- Weijie Huang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle detecting device and charged particle beam system...
- Patent number 10,037,862
- Issue date Jul 31, 2018
- Carl Zeiss Microscopy, LLC
- Sybren J. Sijbrandij
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,640,364
- Issue date May 2, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,627,172
- Issue date Apr 18, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,536,699
- Issue date Jan 3, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,530,612
- Issue date Dec 27, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,530,611
- Issue date Dec 27, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,236,225
- Issue date Jan 12, 2016
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,218,935
- Issue date Dec 22, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,218,934
- Issue date Dec 22, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Systems and methods for a gas field ionization source
- Patent number 9,159,527
- Issue date Oct 13, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,029,765
- Issue date May 12, 2015
- Carl Zeiss Microscopy, LLC
- Richard Comunale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,012,867
- Issue date Apr 21, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle detectors
- Patent number 9,000,396
- Issue date Apr 7, 2015
- Carl Zeiss Microscopy, LLC
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source with light monitoring for tip temperature d...
- Patent number 8,993,981
- Issue date Mar 31, 2015
- Carl Zeiss Microscopy, LLC
- John Notte
- G05 - CONTROLLING REGULATING
Information Patent Grant
Reducing particle implantation
- Patent number 8,907,277
- Issue date Dec 9, 2014
- Carl Zeiss Microscopy, LLC
- Rainer Knippelmeyer
- G01 - MEASURING TESTING
Information Patent Grant
Variable energy charged particle systems
- Patent number 8,766,210
- Issue date Jul 1, 2014
- Carl Zeiss Microscopy, LLC
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,748,845
- Issue date Jun 10, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample inspection methods, systems and components
- Patent number 8,669,525
- Issue date Mar 11, 2014
- Carl Zeiss Microscopy, LLC
- Sybren Sijbrandij
- G01 - MEASURING TESTING
Information Patent Grant
Isotope ion microscope methods and systems
- Patent number 8,648,299
- Issue date Feb 11, 2014
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,633,451
- Issue date Jan 21, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Ion beam stabilization
- Patent number 8,563,954
- Issue date Oct 22, 2013
- Carl Zeiss Microscopy, LLC
- FHM-Faridur Rahman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas delivery system with voltage gradient for an ion microscope
- Patent number 8,558,192
- Issue date Oct 15, 2013
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,461,557
- Issue date Jun 11, 2013
- Carl Zeiss Microscopy, LLC
- Richard Comunale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isotope ion microscope methods and systems
- Patent number 8,399,834
- Issue date Mar 19, 2013
- Carl Zeiss NTS, LLC
- John Notte
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring three-dimensional surface roughness of a structure
- Patent number 7,348,556
- Issue date Mar 25, 2008
- FEI Company
- Prasanna Chitturi
- G01 - MEASURING TESTING
Information Patent Grant
Dual electron beam instrument for multi-perspective
- Patent number 6,812,462
- Issue date Nov 2, 2004
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20240288391
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20220260508
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHODS
- Publication number 20190189392
- Publication date Jun 20, 2019
- Carl Zeiss Microscopy, LLC
- Chuong Huynh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20170294285
- Publication date Oct 12, 2017
- Weijie Huang
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Application
CHARGED PARTICLE DETECTING DEVICE AND CHARGED PARTICLE BEAM SYSTEM...
- Publication number 20170032925
- Publication date Feb 2, 2017
- Carl Zeiss Microscopy, LLC
- Sybren J. Sijbrandij
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHODS
- Publication number 20160203948
- Publication date Jul 14, 2016
- Carl Zeiss Microscopy, LLC
- Chuong Huynh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Method of Operating a Charged Part...
- Publication number 20160111243
- Publication date Apr 21, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Method of Operating a Charged Part...
- Publication number 20160104598
- Publication date Apr 14, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20150213997
- Publication date Jul 30, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Method of Operating a Charged Part...
- Publication number 20150008333
- Publication date Jan 8, 2015
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008332
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008334
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008341
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008342
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20140306121
- Publication date Oct 16, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20130256532
- Publication date Oct 3, 2013
- Carl Zeiss Microscopy, LLC
- Richard Comunale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
- Publication number 20130175444
- Publication date Jul 11, 2013
- CARL ZEISS NTS, LLC.
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR A GAS FIELD IONIZATION SOURCE
- Publication number 20080217555
- Publication date Sep 11, 2008
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING DOPANT INFORMATION
- Publication number 20080111069
- Publication date May 15, 2008
- ALIS Corporation
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR A HELIUM ION PUMP
- Publication number 20070227883
- Publication date Oct 4, 2007
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and methods for a gas field ionization source
- Publication number 20070228287
- Publication date Oct 4, 2007
- Alis Technology Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion sources, systems and methods
- Publication number 20070221843
- Publication date Sep 27, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Systems and methods for a gas field ion microscope
- Publication number 20070215802
- Publication date Sep 20, 2007
- Alis Technology Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210250
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210251
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070205375
- Publication date Sep 6, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194251
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194226
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070187621
- Publication date Aug 16, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158555
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY

John Anthony Notte

Person

Patents Grantslast 30 patents

System to inspect, modify or analyze a region of interest of a samp...

Charged particle beam system and methods

Charged particle beam system

Charged particle detecting device and charged particle beam system...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Ion sources, systems and methods

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Systems and methods for a gas field ionization source

Ion sources, systems and methods

Ion sources, systems and methods

Charged particle detectors

Charged particle source with light monitoring for tip temperature d...

Reducing particle implantation

Variable energy charged particle systems

Ion sources, systems and methods

Sample inspection methods, systems and components

Isotope ion microscope methods and systems

Ion sources, systems and methods

Ion beam stabilization

Gas delivery system with voltage gradient for an ion microscope

Ion sources, systems and methods

Isotope ion microscope methods and systems

Method of measuring three-dimensional surface roughness of a structure

Dual electron beam instrument for multi-perspective

Patents Applicationslast 30 patents

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

CHARGED PARTICLE BEAM SYSTEM AND METHODS

CHARGED PARTICLE BEAM SYSTEM

CHARGED PARTICLE DETECTING DEVICE AND CHARGED PARTICLE BEAM SYSTEM...

CHARGED PARTICLE BEAM SYSTEM AND METHODS

Charged Particle Beam System and Method of Operating a Charged Part...

Charged Particle Beam System and Method of Operating a Charged Part...

ION SOURCES, SYSTEMS AND METHODS

Charged Particle Beam System and Method of Operating a Charged Part...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

ION SOURCES, SYSTEMS AND METHODS

ION SOURCES, SYSTEMS AND METHODS

ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS

SYSTEMS AND METHODS FOR A GAS FIELD IONIZATION SOURCE

DETERMINING DOPANT INFORMATION

SYSTEMS AND METHODS FOR A HELIUM ION PUMP

Systems and methods for a gas field ionization source

Ion sources, systems and methods

Systems and methods for a gas field ion microscope

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods