John B. Rettig

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Aloha, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
High frequency time domain reflectometry probing system
- Patent number 10,012,686
- Issue date Jul 3, 2018
- Tektronix, Inc.
- John B. Rettig
- G01 - MEASURING TESTING
Information Patent Grant
Time shifting signal acquisition probe system
- Patent number 7,463,015
- Issue date Dec 9, 2008
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Accessory with internal adjustments controlled by host
- Patent number 6,232,764
- Issue date May 15, 2001
- Tektronix, Inc.
- John B. Rettig
- G01 - MEASURING TESTING
Information Patent Grant
High speed step generator output circuit
- Patent number 4,924,110
- Issue date May 8, 1990
- Tektronix, Inc.
- John B. Rettig
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dual channel time domain reflectometer
- Patent number 4,755,742
- Issue date Jul 5, 1988
- Tektronix, Inc.
- Agoston Agoston
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Frequency Time Domain Reflectometry Probing System
- Publication number 20180045769
- Publication date Feb 15, 2018
- Tektronix, Inc.
- John B. Rettig
- G01 - MEASURING TESTING
Information Patent Application
Time shifting signal acquisition probe system
- Publication number 20080159368
- Publication date Jul 3, 2008
- Michael J. Mende
- G01 - MEASURING TESTING