John B. Robbins

Person

McKinney, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for patterning thick layers
- Patent number 10,811,492
- Issue date Oct 20, 2020
- Texas Instruments Incorporated
- Jeffrey Alan West
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for forming PZT or PLZT thinfilms with low defectivity
- Patent number 10,354,858
- Issue date Jul 16, 2019
- Texas Instruments Incorporated
- Asad Mahmood Haider
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
High-resistance thin-film resistor and method of forming the resistor
- Patent number 8,754,741
- Issue date Jun 17, 2014
- Texas Instruments Incorporated
- Byron Lovell Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment mark for opaque layer
- Patent number 8,324,742
- Issue date Dec 4, 2012
- Texas Instruments Incorporated
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment mark for opaque layer
- Patent number 8,268,696
- Issue date Sep 18, 2012
- Texas Instruments Incorporated
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of surface protection of a semiconductor wafer during polishing
- Patent number 5,424,224
- Issue date Jun 13, 1995
- Texas Instruments Incorporated
- Franklin L. Allen
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for back side damage of silicon wafers
- Patent number 5,197,271
- Issue date Mar 30, 1993
- Texas Instruments Incorporated
- John Robbins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for backside damage of silicon wafers
- Patent number 5,006,475
- Issue date Apr 9, 1991
- Texas Instruments Incorporated
- John Robbins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Iodine sterilization of deionized water in semiconductor processing
- Patent number 4,935,064
- Issue date Jun 19, 1990
- Texas Instruments Incorporated
- John B. Robbins
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR PATTERNING THICK LAYERS
- Publication number 20200135841
- Publication date Apr 30, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Jeffrey Alan West
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROCESS FOR FORMING PZT OR PLZT THINFILMS WITH LOW DEFECTIVITY
- Publication number 20150187570
- Publication date Jul 2, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Asad Mahmood HAIDER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Resistance Thin-Film Resistor and Method of Forming the Resistor
- Publication number 20140111301
- Publication date Apr 24, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Byron Lovell Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT MARK FOR OPAQUE LAYER
- Publication number 20110306176
- Publication date Dec 15, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT MARK FOR OPAQUE LAYER
- Publication number 20090243122
- Publication date Oct 1, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS

John B. Robbins

Person

Patents Grantslast 30 patents

Method and device for patterning thick layers

Process for forming PZT or PLZT thinfilms with low defectivity

High-resistance thin-film resistor and method of forming the resistor

Alignment mark for opaque layer

Alignment mark for opaque layer

Method of surface protection of a semiconductor wafer during polishing

Method and apparatus for back side damage of silicon wafers

Method for backside damage of silicon wafers

Iodine sterilization of deionized water in semiconductor processing

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR PATTERNING THICK LAYERS

PROCESS FOR FORMING PZT OR PLZT THINFILMS WITH LOW DEFECTIVITY

High-Resistance Thin-Film Resistor and Method of Forming the Resistor

ALIGNMENT MARK FOR OPAQUE LAYER

ALIGNMENT MARK FOR OPAQUE LAYER