John Bernard Medberry

Person

Windsor, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method, apparatus and system for aligning an optical fiber end with...
- Patent number 6,954,265
- Issue date Oct 11, 2005
- Agilent Technologies, Inc.
- William P Kennedy
- G02 - OPTICS
Information Patent Grant
Method for the calibration and alignment of multiple multi-axis mot...
- Patent number 6,809,823
- Issue date Oct 26, 2004
- Agilent Technologies, Inc.
- William P Kennedy
- G01 - MEASURING TESTING
Information Patent Grant
Sub-micron accuracy edge detector
- Patent number 6,806,484
- Issue date Oct 19, 2004
- Agilent Technologies, Inc.
- Edward Steketee
- G01 - MEASURING TESTING
Information Patent Grant
Alignment of optical fiber elements
- Patent number 6,778,740
- Issue date Aug 17, 2004
- Agilent Technologies, Inc.
- John Bernard Medberry
- G02 - OPTICS
Information Patent Grant
Sub-micron accuracy edge detector
- Patent number 6,765,223
- Issue date Jul 20, 2004
- Agilent Technologies, Inc.
- John Bernard Medberry
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus and system for aligning an optical fiber end with...
- Patent number 6,748,141
- Issue date Jun 8, 2004
- Agilent Technologies, Inc.
- William P Kennedy
- G02 - OPTICS
Information Patent Grant
Method, apparatus and system for testing one or more waveguides of...
- Patent number 6,690,454
- Issue date Feb 10, 2004
- Agilent Technologies, Inc.
- William P Kennedy
- G01 - MEASURING TESTING
Information Patent Grant
System and method for coupling light through a waveguide in a plana...
- Patent number 6,493,072
- Issue date Dec 10, 2002
- Agilent Technologies, Inc.
- John Medberry
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Method, apparatus and system for aligning an optical fiber end with...
- Publication number 20040170360
- Publication date Sep 2, 2004
- William P. Kennedy
- G02 - OPTICS
Information Patent Application
Alignment of optical fiber elements
- Publication number 20040022498
- Publication date Feb 5, 2004
- John Bernard Medberry
- G02 - OPTICS
Information Patent Application
METHOD, APPARATUS AND SYSTEM FOR TESTING ONE OR MORE WAVEGUIDES OF...
- Publication number 20030202171
- Publication date Oct 30, 2003
- William P. Kennedy
- G01 - MEASURING TESTING
Information Patent Application
Method, apparatus and system for aligning an optical fiber end with...
- Publication number 20030185516
- Publication date Oct 2, 2003
- William P. Kennedy
- G02 - OPTICS
Information Patent Application
Method for the calibration and alignment of multiple multi-axis mot...
- Publication number 20030063277
- Publication date Apr 3, 2003
- William P. Kennedy
- G01 - MEASURING TESTING
Information Patent Application
Sub-micron accuracy edge detector
- Publication number 20030063294
- Publication date Apr 3, 2003
- John Bernard Medberry
- G01 - MEASURING TESTING
Information Patent Application
Sub-micron accuracy edge detector
- Publication number 20030042441
- Publication date Mar 6, 2003
- Edward Steketee
- G01 - MEASURING TESTING

John Bernard Medberry

Person

Patents Grantslast 30 patents

Method, apparatus and system for aligning an optical fiber end with...

Method for the calibration and alignment of multiple multi-axis mot...

Sub-micron accuracy edge detector

Alignment of optical fiber elements

Sub-micron accuracy edge detector

Method, apparatus and system for aligning an optical fiber end with...

Method, apparatus and system for testing one or more waveguides of...

System and method for coupling light through a waveguide in a plana...

Patents Applicationslast 30 patents

Method, apparatus and system for aligning an optical fiber end with...

Alignment of optical fiber elements

METHOD, APPARATUS AND SYSTEM FOR TESTING ONE OR MORE WAVEGUIDES OF...

Method, apparatus and system for aligning an optical fiber end with...

Method for the calibration and alignment of multiple multi-axis mot...

Sub-micron accuracy edge detector

Sub-micron accuracy edge detector