John C. Barker

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Oakington, GB

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Patents Grantslast 30 patents

Information Patent Grant
Image inspection system for defect detection
- Patent number 4,587,617
- Issue date May 6, 1986
- Cambridge Instruments Limited
- John C. Barker
- G01 - MEASURING TESTING
Information Patent Grant
Image comparison systems
- Patent number 4,578,765
- Issue date Mar 25, 1986
- Cambridge Instruments Limited
- John C. Barker
- G06 - COMPUTING CALCULATING COUNTING