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John C. Calvin
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Portland, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
DF/dT trigger system and method
Patent number
8,866,468
Issue date
Oct 21, 2014
Tektronix, Inc.
Patrick A. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Synthesis and generation of arbitrary waveforms with ISI components...
Patent number
8,224,613
Issue date
Jul 17, 2012
Tektronix, Inc.
John C. Calvin
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for synthesizing and generating an SSC modulat...
Patent number
8,165,184
Issue date
Apr 24, 2012
Tektronix, Inc.
Ramachandra Cv
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Transport delay and jitter measurements
Patent number
7,912,117
Issue date
Mar 22, 2011
Tektronix, Inc.
Kan Tan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Encoded serial data bit error detector
Patent number
7,801,206
Issue date
Sep 21, 2010
Tektronix, Inc.
John C. Calvin
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Oscilloscope having advanced triggering capability
Patent number
7,191,079
Issue date
Mar 13, 2007
Tektronix, Inc.
Patrick A. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Method for optimized rendering of eye diagrams synchronized to a re...
Patent number
6,836,738
Issue date
Dec 28, 2004
Tektronix, Inc.
Kalev Sepp
G01 - MEASURING TESTING
Information
Patent Grant
Deskew fixture
Patent number
6,614,221
Issue date
Sep 2, 2003
Tektronix, Inc.
Kelly F. Cushing
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
dF/dT TRIGGER SYSTEM AND METHOD
Publication number
20120194169
Publication date
Aug 2, 2012
Tektronix, Inc.
Patrick A. SMITH
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Apparatus and Method for Generating a Waveform Test Signal Having C...
Publication number
20110235694
Publication date
Sep 29, 2011
Tektronix, Inc.
Ransom W. Stephens
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for synthesizing and generating an SSC modulat...
Publication number
20090207886
Publication date
Aug 20, 2009
Tektronix.com
Ramachandra CV
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYNTHESIS AND GENERATION OF ARBITRARY WAVEFORMS WITH ISI COMPONENTS...
Publication number
20080228426
Publication date
Sep 18, 2008
Tektronix, Inc.
John C. CALVIN
G01 - MEASURING TESTING
Information
Patent Application
Transport delay and jitter measurements
Publication number
20080080605
Publication date
Apr 3, 2008
Kan Tan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Encoded serial data bit error detector
Publication number
20060245484
Publication date
Nov 2, 2006
John C. Calvin
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Oscilloscope having advanced triggering capability
Publication number
20050225310
Publication date
Oct 13, 2005
Patrick A. Smith
G01 - MEASURING TESTING
Information
Patent Application
Method for optimized rendering of eye diagrams synchronized to a re...
Publication number
20040002826
Publication date
Jan 1, 2004
Kalev Sepp
G01 - MEASURING TESTING
Information
Patent Application
Deskew fixture
Publication number
20030128023
Publication date
Jul 10, 2003
Kelly F. Cushing
G01 - MEASURING TESTING