John C. Egermeier

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
As-deposited planar optical waveguides with low scattering loss and...
- Patent number 7,469,558
- Issue date Dec 30, 2008
- SpringWorks, LLC
- Richard E. Demaray
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for the detection of high pressure conditions...
- Patent number 7,302,854
- Issue date Dec 4, 2007
- Jennings Technology
- Roderick C. Mosely
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for superior step coverage and interface control for high K...
- Patent number 6,358,810
- Issue date Mar 19, 2002
- Applied Materials, Inc.
- Charles Dornfest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Target misalignment detector
- Patent number 6,280,579
- Issue date Aug 28, 2001
- Applied Materials, Inc.
- Seh Kwang Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Gas processing techniques
- Patent number 6,223,540
- Issue date May 1, 2001
- Applied Materials, Inc.
- John Egermeier
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Article formed by in-situ cleaning a Ti target in a Ti+TiN coating...
- Patent number 5,607,776
- Issue date Mar 4, 1997
- Applied Materials, Inc.
- Mark A. Mueller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for in-situ cleaning a Ti target in a Ti + TiN coating process
- Patent number 5,427,666
- Issue date Jun 27, 1995
- Applied Materials, Inc.
- Mark A. Mueller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for the detection of high pressure conditions...
- Publication number 20060196274
- Publication date Sep 7, 2006
- John Egermeier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for the detection of high pressure conditions...
- Publication number 20050258342
- Publication date Nov 24, 2005
- John Egermeier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
As-deposited planar optical waveguides with low scattering loss and...
- Publication number 20030063883
- Publication date Apr 3, 2003
- Richard E. Demaray
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Detection of contaminants on semiconductor wafers
- Publication number 20020006677
- Publication date Jan 17, 2002
- John Egermeier
- H01 - BASIC ELECTRIC ELEMENTS

John C. Egermeier

Person

Patents Grantslast 30 patents

As-deposited planar optical waveguides with low scattering loss and...

Method and apparatus for the detection of high pressure conditions...

Method for superior step coverage and interface control for high K...

Target misalignment detector

Gas processing techniques

Article formed by in-situ cleaning a Ti target in a Ti+TiN coating...

Method for in-situ cleaning a Ti target in a Ti + TiN coating process

Patents Applicationslast 30 patents

Method and apparatus for the detection of high pressure conditions...

Method and apparatus for the detection of high pressure conditions...

As-deposited planar optical waveguides with low scattering loss and...

Detection of contaminants on semiconductor wafers