Oakland, CA, US
Information
Patent Grant
The Regents of the University of California
John C. Hoenninger
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
John C. Hoenninger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
The Regents of the University of California
John C. Hoenninger
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
John C. Hoenninger
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
John C. Hoenninger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
The Regents of the University of California
John Van Heteren
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
John C. Hoenninger
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
Jack H. Zeilenga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
The Regents of the University of California
Lawrence E. Crooks
324 - Electricity: measuring and testing
Information
Patent Grant
The Regents of the University of California
Lawrence E. Crooks
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
John C. Hoenninger
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of Calif.
John C. Hoenninger
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of Calif.
Lawrence E. Crooks
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
Lawrence E. Crooks
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
Lawrence E. Crooks
G01 - MEASURING TESTING
