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John C Kerley
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Elbert, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and structure for AC coupled insitu ESD protection
Patent number
7,333,311
Issue date
Feb 19, 2008
Agilent Technologies, Inc.
John C. Kerley
G01 - MEASURING TESTING
Information
Patent Grant
Split resistor probe and method
Patent number
6,362,635
Issue date
Mar 26, 2002
Agilent Technologies, Inc.
Steven D Draving
G01 - MEASURING TESTING
Information
Patent Grant
Split resistor probe and method
Patent number
6,225,816
Issue date
May 1, 2001
Agilent Technologies, Inc.
Steven D Draving
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and structure for AC coupled insitu ESD protection
Publication number
20060268475
Publication date
Nov 30, 2006
John C. Kerley
G01 - MEASURING TESTING
Information
Patent Application
Split resistor probe and method
Publication number
20010002794
Publication date
Jun 7, 2001
Steven D. Draving
G01 - MEASURING TESTING