John C. Pritiskutch

Person

Orwigsburg, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
MOSFET devices with asymmetric structural configurations introducin...
- Patent number 9,837,320
- Issue date Dec 5, 2017
- STMicroelectronics, Inc.
- John C. Pritiskutch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOSFET devices with asymmetric structural configurations introducin...
- Patent number 9,673,103
- Issue date Jun 6, 2017
- STMicroelectronics, Inc.
- John C. Pritiskutch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Preventing shorting dendritic migration between electrodes
- Patent number 9,018,765
- Issue date Apr 28, 2015
- STMicroelectronics, Inc.
- John C. Pritiskutch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for pre-migration of metal ions in a semiconducto...
- Patent number 8,980,747
- Issue date Mar 17, 2015
- STMicroelectronics, Inc.
- Craig J. Rotay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dendrite resistant input bias network for metal oxide semiconductor...
- Patent number 8,803,599
- Issue date Aug 12, 2014
- STMicroelectronics, Inc.
- John C. Pritiskutch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for pre-migration of metal ions in a semiconductor package
- Patent number 8,557,703
- Issue date Oct 15, 2013
- STMicroelectronics, Inc.
- Craig J. Rotay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor indicator for voltage diagnostics in power amplifiers
- Patent number 7,459,979
- Issue date Dec 2, 2008
- STMicroelectronics, Inc.
- Craig J. Rotay
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MOSFET DEVICES WITH ASYMMETRIC STRUCTURAL CONFIGURATIONS INTRODUCIN...
- Publication number 20170236758
- Publication date Aug 17, 2017
- STMicroelectronics, Inc.
- John C. Pritiskutch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOSFET DEVICES WITH ASYMMETRIC STRUCTURAL CONFIGURATIONS INTRODUCIN...
- Publication number 20170005009
- Publication date Jan 5, 2017
- STMicroelectronics, Inc.
- John C. Pritiskutch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREVENTING SHORTING DENDRITIC MIGRATION BETWEEN ELECTRODES
- Publication number 20140138834
- Publication date May 22, 2014
- STMicroelectronics, Inc.
- John C. Pritiskutch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PRE-MIGRATION OF METAL IONS IN A SEMICONDUCTO...
- Publication number 20140077346
- Publication date Mar 20, 2014
- STMicroelectronics, Inc.
- Craig J. Rotay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for pre-migration of metal ions in a semiconducto...
- Publication number 20120037990
- Publication date Feb 16, 2012
- STMicroelectronics, Inc.
- Craig J. Rotay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dendrite resistant input bias network for metal oxide semiconductor...
- Publication number 20110291752
- Publication date Dec 1, 2011
- STMicroelectronics, Inc.
- John C. Pritiskutch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor indicator for voltage diagnostics in power amplifiers
- Publication number 20060197602
- Publication date Sep 7, 2006
- STMicroelectronics, Inc.
- Craig J. Rotay
- H03 - BASIC ELECTRONIC CIRCUITRY

John C. Pritiskutch

Person

Patents Grantslast 30 patents

MOSFET devices with asymmetric structural configurations introducin...

MOSFET devices with asymmetric structural configurations introducin...

Preventing shorting dendritic migration between electrodes

Method and system for pre-migration of metal ions in a semiconducto...

Dendrite resistant input bias network for metal oxide semiconductor...

Method for pre-migration of metal ions in a semiconductor package

Semiconductor indicator for voltage diagnostics in power amplifiers

Patents Applicationslast 30 patents

MOSFET DEVICES WITH ASYMMETRIC STRUCTURAL CONFIGURATIONS INTRODUCIN...

MOSFET DEVICES WITH ASYMMETRIC STRUCTURAL CONFIGURATIONS INTRODUCIN...

PREVENTING SHORTING DENDRITIC MIGRATION BETWEEN ELECTRODES

METHOD AND SYSTEM FOR PRE-MIGRATION OF METAL IONS IN A SEMICONDUCTO...

Method and system for pre-migration of metal ions in a semiconducto...

Dendrite resistant input bias network for metal oxide semiconductor...

Semiconductor indicator for voltage diagnostics in power amplifiers