John C. Valcore JR.

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for tuning a MHz RF generator within a cycle of...
- Patent number 11,929,235
- Issue date Mar 12, 2024
- Lam Research Corporation
- Arthur M. Howald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for controlling plasma in a plasma processing...
- Patent number 11,798,784
- Issue date Oct 24, 2023
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustment of power and frequency based on three or more states
- Patent number 11,361,942
- Issue date Jun 14, 2022
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using modeling for identifying a location of a fault in an RF trans...
- Patent number 10,950,421
- Issue date Mar 16, 2021
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for reducing power reflected towards a higher f...
- Patent number 10,911,081
- Issue date Feb 2, 2021
- Lam Research Corporation
- Arthur M. Howald
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods for tuning an impedance matching network in a s...
- Patent number 10,853,444
- Issue date Dec 1, 2020
- Lam Research Corporation
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Feedback control system for iterative etch process
- Patent number 10,832,979
- Issue date Nov 10, 2020
- Lam Research Corporation
- Arthur M. Howald
- G01 - MEASURING TESTING
Information Patent Grant
Segmenting a model within a plasma system
- Patent number 10,762,266
- Issue date Sep 1, 2020
- Lam Research Corporation
- John C. Valcore
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RF impedance model based fault detection
- Patent number 10,748,748
- Issue date Aug 18, 2020
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using modeling to determine ion energy associated with a plasma system
- Patent number 10,707,056
- Issue date Jul 7, 2020
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustment of power and frequency based on three or more states
- Patent number 10,629,413
- Issue date Apr 21, 2020
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for tuning an impedance matching network in a s...
- Patent number 10,621,265
- Issue date Apr 14, 2020
- Lam Research Corporation
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual push between a host computer system and an RF generator
- Patent number 10,536,183
- Issue date Jan 14, 2020
- Lam Research Corporation
- John C. Valcore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Segmenting a model within a plasma system
- Patent number 10,474,780
- Issue date Nov 12, 2019
- Lam Research Corporation
- John C. Valcore
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for using computer-generated models to reduce r...
- Patent number 10,469,108
- Issue date Nov 5, 2019
- Lam Research Corporation
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RF metrology system for a substrate processing apparatus incorporat...
- Patent number 10,432,248
- Issue date Oct 1, 2019
- Lam Research Corporation
- Ernest Beauel Hanks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for tuning an impedance matching network in a s...
- Patent number 10,403,482
- Issue date Sep 3, 2019
- Lam Research Corporation
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control of etch rate using modeling, feedback and impedance match
- Patent number 10,381,201
- Issue date Aug 13, 2019
- Lam Research Corporation
- Bradford J. Lyndaker
- G05 - CONTROLLING REGULATING
Information Patent Grant
Active feedback control of subsystems of a process module
- Patent number 10,366,869
- Issue date Jul 30, 2019
- Lam Research Corporation
- Scott Riggs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using modeling to determine wafer bias associated with a plasma system
- Patent number 10,340,127
- Issue date Jul 2, 2019
- Lam Research Corporation
- John C. Valcore
- G01 - MEASURING TESTING
Information Patent Grant
Multiple control modes
- Patent number 10,325,759
- Issue date Jun 18, 2019
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and apparatus for using optical data to monitor RF g...
- Patent number 10,325,760
- Issue date Jun 18, 2019
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining a malfunctioning device in a plasma system
- Patent number 10,319,570
- Issue date Jun 11, 2019
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for tuning an impedance matching network in a s...
- Patent number 10,296,676
- Issue date May 21, 2019
- Lam Research Corporation
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for using computer-generated models to reduce r...
- Patent number 10,276,350
- Issue date Apr 30, 2019
- Lam Research Corporation
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for increasing efficiency of delivered power of...
- Patent number 10,256,078
- Issue date Apr 9, 2019
- Lam Research Corporation
- Arthur M. Howald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sub-pulsing during a state
- Patent number 10,256,077
- Issue date Apr 9, 2019
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
State-based adjustment of power and frequency
- Patent number 10,231,321
- Issue date Mar 12, 2019
- Lam Research Corporation
- John C. Valcore
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Systems and methods for synchronizing execution of recipe sets
- Patent number 10,191,466
- Issue date Jan 29, 2019
- Lam Research Corporation
- John C. Valcore
- G05 - CONTROLLING REGULATING
Information Patent Grant
Computation of statistics for statistical data decimation
- Patent number 10,163,605
- Issue date Dec 25, 2018
- Lam Research Corporation
- Andrew S. Fong
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR TUNING A MHZ RF GENERATOR WITHIN A CYCLE OF...
- Publication number 20240186111
- Publication date Jun 6, 2024
- LAM RESEARCH CORPORATION
- Arthur M. Howald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR CONTROLLING PLASMA IN A PLASMA PROCESSING...
- Publication number 20240021408
- Publication date Jan 18, 2024
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Analyzing and Intelligently Collecting Sens...
- Publication number 20230282465
- Publication date Sep 7, 2023
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR DATA COMPRESSION IN A PLASMA TOOL
- Publication number 20230207267
- Publication date Jun 29, 2023
- LAM RESEARCH CORPORATION
- John Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTMENT OF POWER AND FREQUENCY BASED ON THREE OR MORE STATES
- Publication number 20220277934
- Publication date Sep 1, 2022
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TUNING A MHZ RF GENERATOR WITHIN A CYCLE OF...
- Publication number 20220165543
- Publication date May 26, 2022
- LAM RESEARCH CORPORATION
- Arthur M. Howald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTMENT OF POWER AND FREQUENCY BASED ON THREE OR MORE STATES
- Publication number 20200243304
- Publication date Jul 30, 2020
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TUNING AN IMPEDANCE MATCHING NETWORK IN A S...
- Publication number 20200218774
- Publication date Jul 9, 2020
- LAM RESEARCH CORPORATION
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEGMENTING A MODEL WITHIN A PLASMA SYSTEM
- Publication number 20200074034
- Publication date Mar 5, 2020
- LAM RESEARCH CORPORATION
- John C. Valcore
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING POWER REFLECTED TOWARDS A HIGHER F...
- Publication number 20200067545
- Publication date Feb 27, 2020
- LAM RESEARCH CORPORATION
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL OF ETCH RATE USING MODELING, FEEDBACK AND IMPEDANCE MATCH
- Publication number 20190318919
- Publication date Oct 17, 2019
- LAM RESEARCH CORPORATION
- Bradford J. Lyndaker
- G05 - CONTROLLING REGULATING
Information Patent Application
RF METROLOGY SYSTEM FOR A SUBSTRATE PROCESSING APPARATUS INCORPORAT...
- Publication number 20190288737
- Publication date Sep 19, 2019
- LAM RESEARCH CORPORATION
- Ernest Beauel HANKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TUNING AN IMPEDANCE MATCHING NETWORK IN A S...
- Publication number 20190272306
- Publication date Sep 5, 2019
- LAM RESEARCH CORPORATION
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Feedback Control System for Iterative Etch Process
- Publication number 20190259674
- Publication date Aug 22, 2019
- LAM RESEARCH CORPORATION
- Arthur M. Howald
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE FEEDBACK CONTROL OF SUBSYSTEMS OF A PROCESS MODULE
- Publication number 20190157039
- Publication date May 23, 2019
- LAM RESEARCH CORPORATION
- Scott Riggs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RF IMPEDANCE MODEL BASED FAULT DETECTION
- Publication number 20190057847
- Publication date Feb 21, 2019
- LAM RESEARCH CORPORATION
- John C. Valcore
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Dual Push Between A Host Computer System And An RF Generator
- Publication number 20190044565
- Publication date Feb 7, 2019
- LAM RESEARCH CORPORATION
- John C. Valcore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Systems and Methods for Increasing Efficiency of Delivered Power of...
- Publication number 20190027342
- Publication date Jan 24, 2019
- LAM RESEARCH CORPORATION
- Arthur M. Howald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR CONTROLLING PLASMA IN A PLASMA PROCESSING...
- Publication number 20180323038
- Publication date Nov 8, 2018
- LAM RESEARCH CORPORATION
- John C. Valcore
- B44 - DECORATIVE ARTS
Information Patent Application
Sub-Pulsing During a State
- Publication number 20180294140
- Publication date Oct 11, 2018
- LAM RESEARCH CORPORATION
- John C. Valcore
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Using Modeling To Determine Ion Energy Associated With A Plasma System
- Publication number 20180068834
- Publication date Mar 8, 2018
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Computation Of Statistics For Statistical Data Decimation
- Publication number 20180053632
- Publication date Feb 22, 2018
- LAM RESEARCH CORPORATION
- Andrew S. Fong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sub-Pulsing During a State
- Publication number 20180033596
- Publication date Feb 1, 2018
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Segmenting A Model Within A Plasma System
- Publication number 20180018418
- Publication date Jan 18, 2018
- LAM RESEARCH CORPORATION
- John C. Valcore
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTMENT OF POWER AND FREQUENCY BASED ON THREE OR MORE STATES
- Publication number 20170330732
- Publication date Nov 16, 2017
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TUNING AN IMPEDANCE MATCHING NETWORK IN A S...
- Publication number 20170294293
- Publication date Oct 12, 2017
- LAM RESEARCH CORPORATION
- Arthur M. Howald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDGE RAMPING
- Publication number 20170263419
- Publication date Sep 14, 2017
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual Push Between A Host Computer System And An RF Generator
- Publication number 20170257134
- Publication date Sep 7, 2017
- LAM RESEARCH CORPORATION
- John C. Valcore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM, METHOD AND APPARATUS FOR USING OPTICAL DATA TO MONITOR RF G...
- Publication number 20170200592
- Publication date Jul 13, 2017
- LAM RESEARCH CORPORATION
- John C. Valcore
- G01 - MEASURING TESTING
Information Patent Application
CONTROL OF ETCH RATE USING MODELING, FEEDBACK AND IMPEDANCE MATCH
- Publication number 20170194130
- Publication date Jul 6, 2017
- LAM RESEARCH CORPORATION
- Bradford J. Lyndaker
- H01 - BASIC ELECTRIC ELEMENTS

John C. Valcore JR.

Person

Patents Grantslast 30 patents

Systems and methods for tuning a MHz RF generator within a cycle of...

Methods and apparatus for controlling plasma in a plasma processing...

Adjustment of power and frequency based on three or more states

Using modeling for identifying a location of a fault in an RF trans...

Systems and methods for reducing power reflected towards a higher f...

Systems and methods for tuning an impedance matching network in a s...

Feedback control system for iterative etch process

Segmenting a model within a plasma system

RF impedance model based fault detection

Using modeling to determine ion energy associated with a plasma system

Adjustment of power and frequency based on three or more states

Systems and methods for tuning an impedance matching network in a s...

Dual push between a host computer system and an RF generator

Segmenting a model within a plasma system

Systems and methods for using computer-generated models to reduce r...

RF metrology system for a substrate processing apparatus incorporat...

Systems and methods for tuning an impedance matching network in a s...

Control of etch rate using modeling, feedback and impedance match

Active feedback control of subsystems of a process module

Using modeling to determine wafer bias associated with a plasma system

Multiple control modes

System, method and apparatus for using optical data to monitor RF g...

Determining a malfunctioning device in a plasma system

Systems and methods for tuning an impedance matching network in a s...

Systems and methods for using computer-generated models to reduce r...

Systems and methods for increasing efficiency of delivered power of...

Sub-pulsing during a state

State-based adjustment of power and frequency

Systems and methods for synchronizing execution of recipe sets

Computation of statistics for statistical data decimation

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR TUNING A MHZ RF GENERATOR WITHIN A CYCLE OF...

METHODS AND APPARATUS FOR CONTROLLING PLASMA IN A PLASMA PROCESSING...

Systems and Methods for Analyzing and Intelligently Collecting Sens...

SENSOR DATA COMPRESSION IN A PLASMA TOOL

ADJUSTMENT OF POWER AND FREQUENCY BASED ON THREE OR MORE STATES

SYSTEMS AND METHODS FOR TUNING A MHZ RF GENERATOR WITHIN A CYCLE OF...

ADJUSTMENT OF POWER AND FREQUENCY BASED ON THREE OR MORE STATES

SYSTEMS AND METHODS FOR TUNING AN IMPEDANCE MATCHING NETWORK IN A S...

SEGMENTING A MODEL WITHIN A PLASMA SYSTEM

SYSTEMS AND METHODS FOR REDUCING POWER REFLECTED TOWARDS A HIGHER F...

CONTROL OF ETCH RATE USING MODELING, FEEDBACK AND IMPEDANCE MATCH

RF METROLOGY SYSTEM FOR A SUBSTRATE PROCESSING APPARATUS INCORPORAT...

SYSTEMS AND METHODS FOR TUNING AN IMPEDANCE MATCHING NETWORK IN A S...

Feedback Control System for Iterative Etch Process

ACTIVE FEEDBACK CONTROL OF SUBSYSTEMS OF A PROCESS MODULE

RF IMPEDANCE MODEL BASED FAULT DETECTION

Dual Push Between A Host Computer System And An RF Generator

Systems and Methods for Increasing Efficiency of Delivered Power of...

METHODS AND APPARATUS FOR CONTROLLING PLASMA IN A PLASMA PROCESSING...

Sub-Pulsing During a State

Using Modeling To Determine Ion Energy Associated With A Plasma System

Computation Of Statistics For Statistical Data Decimation

Sub-Pulsing During a State

Segmenting A Model Within A Plasma System

ADJUSTMENT OF POWER AND FREQUENCY BASED ON THREE OR MORE STATES

SYSTEMS AND METHODS FOR TUNING AN IMPEDANCE MATCHING NETWORK IN A S...

EDGE RAMPING

Dual Push Between A Host Computer System And An RF Generator

SYSTEM, METHOD AND APPARATUS FOR USING OPTICAL DATA TO MONITOR RF G...

CONTROL OF ETCH RATE USING MODELING, FEEDBACK AND IMPEDANCE MATCH