John C. Yundt

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of analyzing multiple range test data
- Patent number 5,734,591
- Issue date Mar 31, 1998
- Xyletech Systems, Inc.
- John C. Yundt
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing multiple range test data
- Patent number 5,541,854
- Issue date Jul 30, 1996
- Xyletech Systems, Inc.
- John C. Yundt
- G01 - MEASURING TESTING