John Changala

Person

Tustin, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 11,988,611
- Issue date May 21, 2024
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,821,911
- Issue date Nov 21, 2023
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,808,563
- Issue date Nov 7, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,473,903
- Issue date Oct 18, 2022
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,415,617
- Issue date Aug 16, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer metrology technologies
- Patent number 11,293,965
- Issue date Apr 5, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 11,199,507
- Issue date Dec 14, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,150,287
- Issue date Oct 19, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,092,637
- Issue date Aug 17, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 10,928,188
- Issue date Feb 23, 2021
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 10,663,504
- Issue date May 26, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 10,613,131
- Issue date Apr 7, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 10,591,525
- Issue date Mar 17, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 10,551,325
- Issue date Feb 4, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 10,274,310
- Issue date Apr 30, 2019
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20240019243
- Publication date Jan 18, 2024
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20230003515
- Publication date Jan 5, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20220413029
- Publication date Dec 29, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20220317060
- Publication date Oct 6, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20220260626
- Publication date Aug 18, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
- Publication number 20210131797
- Publication date May 6, 2021
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20210055338
- Publication date Feb 25, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20200408699
- Publication date Dec 31, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20200400732
- Publication date Dec 24, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
- Publication number 20200348348
- Publication date Nov 5, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
- Publication number 20190212132
- Publication date Jul 11, 2019
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20180299497
- Publication date Oct 18, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS
- Publication number 20180292441
- Publication date Oct 11, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20180217193
- Publication date Aug 2, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
- Publication number 20180217192
- Publication date Aug 2, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
- Publication number 20180180404
- Publication date Jun 28, 2018
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20160131594
- Publication date May 12, 2016
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS
- Publication number 20150331029
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20150330908
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHONOLOGIES
- Publication number 20150330909
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
- Publication number 20150331036
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING

John Changala

Person

Patents Grantslast 30 patents

Systems for parsing material properties from within SHG signals

Pump and probe type second harmonic generation metrology

Surface sensing systems and methods for imaging a scanned surface o...

Surface sensing systems and methods for imaging a scanned surface o...

Field-biased second harmonic generation metrology

Wafer metrology technologies

Systems for parsing material properties from within SHG signals

Pump and probe type second harmonic generation metrology

Field-biased second harmonic generation metrology

Surface sensing systems and methods for imaging a scanned surface o...

Field-biased second harmonic generation metrology

Pump and probe type second harmonic generation metrology

Wafer metrology technologies

Systems for parsing material properties from within SHG signals

Surface sensing systems and methods for imaging a scanned surface o...

Patents Applicationslast 30 patents

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

WAFER METROLOGY TECHNOLOGIES

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

WAFER METROLOGY TECHNOLOGIES

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY

SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS

WAFER METROLOGY TECHNOLOGIES

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY

SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

WAFER METROLOGY TECHONOLOGIES

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY