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John D. Garcia
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Vancouver, WA, US
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last 30 patents
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Patent Grant
Wideband high impedance card mountable probe
Patent number
4,783,625
Issue date
Nov 8, 1988
Tektronix, Inc.
Emory J. Harry
G01 - MEASURING TESTING
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Patent Grant
Telescoping pin probe
Patent number
4,739,259
Issue date
Apr 19, 1988
Tektronix, Inc.
Matthew J. Hadwin
G01 - MEASURING TESTING