John D. GREENE

Person

Santa Cruz, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for optimization of inspection speed by gener...
- Patent number 9,780,004
- Issue date Oct 3, 2017
- KLA-Tencor Corporation
- John D. Greene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical system for high-speed and high-sensitivity inspect...
- Patent number 8,664,594
- Issue date Mar 4, 2014
- KLA-Tencor Corporation
- Xinrong Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-beam system for high-speed electron-beam inspection
- Patent number 8,362,425
- Issue date Jan 29, 2013
- KLA-Tencor Corporation
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Grant
High-sensitivity and high-throughput electron beam inspection colum...
- Patent number 8,294,125
- Issue date Oct 23, 2012
- KLA-Tencor Corporation
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Grant
Charge-control pre-scanning for e-beam imaging
- Patent number 7,253,410
- Issue date Aug 7, 2007
- KLA-Tencor Technologies Corporation
- Kirk J. Bertsche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for optically inspecting a sample for anomalies
- Patent number 7,012,683
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for optically inspecting a sample for anomalies
- Patent number 6,833,913
- Issue date Dec 21, 2004
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optical inspection of substrates
- Patent number RE37740
- Issue date Jun 11, 2002
- KLA-Tencor Corporation
- Curt H. Chadwick
- 356 - Optics: measuring and testing
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,502,306
- Issue date Mar 26, 1996
- KLA Instruments Corporation
- Dan Meisburger
- G01 - MEASURING TESTING
Information Patent Grant
Automatic high speed optical inspection system
- Patent number 5,131,755
- Issue date Jul 21, 1992
- Curt H. Chadwick
- G01 - MEASURING TESTING
Information Patent Grant
Automatic high speed optical inspection system
- Patent number 5,085,517
- Issue date Feb 4, 1992
- Curt H. Chadwick
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optical inspection of substrates
- Patent number 4,877,326
- Issue date Oct 31, 1989
- KLA Instruments Corporation
- Curt H. Chadwick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR OPTIMIZATION OF INSPECTION SPEED BY GENER...
- Publication number 20120245861
- Publication date Sep 27, 2012
- John D. GREENE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE-BEAM SYSTEM FOR HIGH-SPEED ELECTRON-BEAM INSPECTION
- Publication number 20120241606
- Publication date Sep 27, 2012
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Application
High-Sensitivity and High-Throughput Electron Beam Inspection Colum...
- Publication number 20110114838
- Publication date May 19, 2011
- Liqun HAN
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for optically inspecting a sample for anomalies
- Publication number 20050092899
- Publication date May 5, 2005
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING

John D. GREENE

Person

Patents Grantslast 30 patents

Methods and apparatus for optimization of inspection speed by gener...

Electron-optical system for high-speed and high-sensitivity inspect...

Multiple-beam system for high-speed electron-beam inspection

High-sensitivity and high-throughput electron beam inspection colum...

Charge-control pre-scanning for e-beam imaging

Apparatus and methods for optically inspecting a sample for anomalies

Apparatus and methods for optically inspecting a sample for anomalies

Method and apparatus for optical inspection of substrates

Electron beam inspection system and method

Automatic high speed optical inspection system

Automatic high speed optical inspection system

Method and apparatus for optical inspection of substrates

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR OPTIMIZATION OF INSPECTION SPEED BY GENER...

MULTIPLE-BEAM SYSTEM FOR HIGH-SPEED ELECTRON-BEAM INSPECTION

High-Sensitivity and High-Throughput Electron Beam Inspection Colum...

Apparatus and methods for optically inspecting a sample for anomalies