John D. Sylvestri

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
High power device fault localization via die surface contouring
- Patent number 11,940,271
- Issue date Mar 26, 2024
- International Business Machines Corporation
- David J. Lewison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
- Patent number 7,993,504
- Issue date Aug 9, 2011
- International Business Machines Corporation
- Terence L Kane
- G01 - MEASURING TESTING
Information Patent Grant
Angular spectrum tailoring in solid immersion microscopy for circui...
- Patent number 7,961,307
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Grant
Angular spectrum tailoring in solid immersion microscopy for circui...
- Patent number 7,826,045
- Issue date Nov 2, 2010
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Grant
Barrier dielectric stack for seam protection
- Patent number 7,397,073
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
- Patent number 7,371,689
- Issue date May 13, 2008
- International Business Machines Corporation
- Terence L Kane
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for single die backside probing of semiconduct...
- Patent number 7,112,983
- Issue date Sep 26, 2006
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Grant
Laser-induced critical parameter analysis of CMOS devices
- Patent number 7,038,474
- Issue date May 2, 2006
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Grant
Specific site backside underlaying and micromasking method for elec...
- Patent number 6,894,522
- Issue date May 17, 2005
- International Business Machines Corporation
- Barbara A. Averill
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH POWER DEVICE FAULT LOCALIZATION VIA DIE SURFACE CONTOURING
- Publication number 20220155049
- Publication date May 19, 2022
- International Business Machines Corporation
- David J. Lewison
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR SPECTRUM TAILORING IN SOLID IMMERSION MICROSCOPY FOR CIRCUI...
- Publication number 20110037973
- Publication date Feb 17, 2011
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR SPECTRUM TAILORING IN SOLID IMMERSION MICROSCOPY FOR CIRCUI...
- Publication number 20090189630
- Publication date Jul 30, 2009
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INTEGRATED CIRCUIT COOLING DURING TESTING AND IMAGE B...
- Publication number 20080272474
- Publication date Nov 6, 2008
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Application
BARRIER DIELECTRIC STACK FOR SEAM PROTECTION
- Publication number 20080227247
- Publication date Sep 18, 2008
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACKSIDE UNLAYERING OF MOSFET DEVICES FOR ELECTRICAL AND PHYSICAL C...
- Publication number 20080128086
- Publication date Jun 5, 2008
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INTEGRATED CIRCUIT COOLING DURING TESTING...
- Publication number 20070164426
- Publication date Jul 19, 2007
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Application
Barrier Dielectric Stack for Seam Protection
- Publication number 20060108609
- Publication date May 25, 2006
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR SINGLE DIE BACKSIDE PROBING OF SEMICONDUCT...
- Publication number 20060097742
- Publication date May 11, 2006
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Application
LASER-INDUCED CRITICAL PARAMETER ANALYSIS OF CMOS DEVICES
- Publication number 20060066325
- Publication date Mar 30, 2006
- International Business Machines Corporation
- Patrick J. McGinnis
- G01 - MEASURING TESTING
Information Patent Application
Backside unlayering of MOSFET devices for electrical and physical c...
- Publication number 20060030160
- Publication date Feb 9, 2006
- IBM CORPORATION
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
SPECIFIC SITE BACKSIDE UNDERLAYING AND MICROMASKING METHOD FOR ELEC...
- Publication number 20050073333
- Publication date Apr 7, 2005
- International Business Machines Corporation
- Barbara A. Averill
- G01 - MEASURING TESTING

John D. Sylvestri

Person

Patents Grantslast 30 patents

High power device fault localization via die surface contouring

Backside unlayering of MOSFET devices for electrical and physical c...

Angular spectrum tailoring in solid immersion microscopy for circui...

Angular spectrum tailoring in solid immersion microscopy for circui...

Barrier dielectric stack for seam protection

Backside unlayering of MOSFET devices for electrical and physical c...

Apparatus and method for single die backside probing of semiconduct...

Laser-induced critical parameter analysis of CMOS devices

Specific site backside underlaying and micromasking method for elec...

Patents Applicationslast 30 patents

HIGH POWER DEVICE FAULT LOCALIZATION VIA DIE SURFACE CONTOURING

ANGULAR SPECTRUM TAILORING IN SOLID IMMERSION MICROSCOPY FOR CIRCUI...

ANGULAR SPECTRUM TAILORING IN SOLID IMMERSION MICROSCOPY FOR CIRCUI...

APPARATUS FOR INTEGRATED CIRCUIT COOLING DURING TESTING AND IMAGE B...

BARRIER DIELECTRIC STACK FOR SEAM PROTECTION

BACKSIDE UNLAYERING OF MOSFET DEVICES FOR ELECTRICAL AND PHYSICAL C...

APPARATUS AND METHOD FOR INTEGRATED CIRCUIT COOLING DURING TESTING...

Barrier Dielectric Stack for Seam Protection

APPARATUS AND METHOD FOR SINGLE DIE BACKSIDE PROBING OF SEMICONDUCT...

LASER-INDUCED CRITICAL PARAMETER ANALYSIS OF CMOS DEVICES

Backside unlayering of MOSFET devices for electrical and physical c...

SPECIFIC SITE BACKSIDE UNDERLAYING AND MICROMASKING METHOD FOR ELEC...