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John D'amico
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Temple Terrace, FL, US
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Patents Grants
last 30 patents
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Patent Grant
Determining composition of mixed dielectrics
Patent number
6,815,974
Issue date
Nov 9, 2004
Semiconductor Diagnostics, Inc.
Jacek Lagowski
G01 - MEASURING TESTING
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Patent Grant
Steady state method for measuring the thickness and the capacitance...
Patent number
6,680,621
Issue date
Jan 20, 2004
Semiconductor Diagnostics, Inc.
Alexander Savtchouk
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Steady state method for measuring the thickness and the capacitance...
Publication number
20020125900
Publication date
Sep 12, 2002
Alexander Savtchouk
G01 - MEASURING TESTING