John DiCosola

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Functional failure analysis techniques for programmable integrated...
- Patent number 7,685,485
- Issue date Mar 23, 2010
- Altera Corporation
- Binh Vo
- G01 - MEASURING TESTING
Information Patent Grant
Method of maintaining signal integrity across a capacitive coupled...
- Patent number 7,319,341
- Issue date Jan 15, 2008
- Altera Corporation
- Michael Harms
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for laser marking of integrated circuit faults
- Patent number 7,020,582
- Issue date Mar 28, 2006
- Altera Corporation
- John M. Dicosola
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Functional failure analysis techniques for programmable integrated...
- Publication number 20050022085
- Publication date Jan 27, 2005
- Altera Corporation
- Binh Vo
- G01 - MEASURING TESTING