John Dinh Hoang

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer level burn-in and electrical test system and method
- Patent number 7,928,754
- Issue date Apr 19, 2011
- AEHR Test Systems
- Donald Paul Richmond, II
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer level burn-in and electrical test system and method
- Patent number 7,619,428
- Issue date Nov 17, 2009
- AEHR Test Systems
- Donald Paul Richmond, II
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level burn-in and electrical test system and method
- Patent number 6,682,945
- Issue date Jan 27, 2004
- AEHR Test Systems
- Donald Paul Richmond
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level burn-in and electrical test system and method
- Patent number 6,562,636
- Issue date May 13, 2003
- AEHR Test Systems
- Donald Paul Richmond
- G01 - MEASURING TESTING
Information Patent Grant
High-density interconnect technique
- Patent number 5,429,510
- Issue date Jul 4, 1995
- Aehr Test Systems, Inc.
- William D. Barraclough
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer Level Burn-In and Electrical Test System and Method
- Publication number 20100176836
- Publication date Jul 15, 2010
- Donald Paul Richmond, II
- G01 - MEASURING TESTING
Information Patent Application
Wafer level burn-in and electrical test system and method
- Publication number 20040113645
- Publication date Jun 17, 2004
- Aehr Test Systems
- Donald Paul Richmond
- G01 - MEASURING TESTING
Information Patent Application
Wafer level burn-in and electrical test system and method
- Publication number 20020048826
- Publication date Apr 25, 2002
- Donald Paul Richmond
- G01 - MEASURING TESTING