John Douglas Corless

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System, apparatus, and method for improved background correction an...
- Patent number 12,174,071
- Issue date Dec 24, 2024
- Verity Instruments, Inc.
- John Corless
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus, and method for spectral filtering
- Patent number 11,885,682
- Issue date Jan 30, 2024
- Verity Instruments, Inc.
- Chris D. Pylant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multimode configurable spectrometer
- Patent number 11,424,115
- Issue date Aug 23, 2022
- Verity Instruments, Inc.
- Larry Arlos Bullock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fiberoptically-coupled measurement system with reduced sensitivity...
- Patent number 10,794,763
- Issue date Oct 6, 2020
- Verity Instruments, Inc.
- Mark A. Meloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for calibration of optical signals in semiconduct...
- Patent number 10,365,212
- Issue date Jul 30, 2019
- Verity Instruments, Inc.
- Andrew Weeks Kueny
- G01 - MEASURING TESTING
Information Patent Grant
High dynamic range measurement system for process monitoring
- Patent number 9,801,265
- Issue date Oct 24, 2017
- Verity Instruments, Inc.
- Larry Arlos Bullock
- G01 - MEASURING TESTING
Information Patent Grant
Referenced and stabilized optical measurement system
- Patent number 9,772,226
- Issue date Sep 26, 2017
- Verity Instruments, Inc.
- John Douglas Corless
- G01 - MEASURING TESTING
Information Patent Grant
Workpiece characterization system
- Patent number 9,383,323
- Issue date Jul 5, 2016
- Verity Instruments, Inc.
- Mark Anthony Meloni
- G01 - MEASURING TESTING
Information Patent Grant
High dynamic range measurement system for process monitoring
- Patent number 9,310,250
- Issue date Apr 12, 2016
- Verity Instruments, Inc.
- Larry Arlos Bullock
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Calibration of a radiometric optical monitoring system used for fau...
- Patent number 8,125,633
- Issue date Feb 28, 2012
- Verity Instruments, Inc.
- Mike Whelan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM, APPARATUS, AND METHOD FOR IMPROVED BACKGROUND CORRECTION AN...
- Publication number 20230366736
- Publication date Nov 16, 2023
- Verity Instruments, Inc.
- John Corless
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, APPARATUS, AND METHOD FOR SPECTRAL FILTERING
- Publication number 20230194342
- Publication date Jun 22, 2023
- Verity Instruments, Inc.
- Chris D. Pylant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIMODE CONFIGURABLE SPECTROMETER
- Publication number 20220406586
- Publication date Dec 22, 2022
- Verity Instruments, Inc.
- Larry Arlos Bullock
- G01 - MEASURING TESTING
Information Patent Application
FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY...
- Publication number 20200264044
- Publication date Aug 20, 2020
- Verity Instruments, Inc.
- Mark A. Meloni
- G01 - MEASURING TESTING
Information Patent Application
MULTIMODE CONFIGURABLE SPECTROMETER
- Publication number 20180286650
- Publication date Oct 4, 2018
- Verity Instruments, Inc.
- Larry Arlos Bullock
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATION OF OPTICAL SIGNALS IN SEMICONDUCT...
- Publication number 20180136118
- Publication date May 17, 2018
- Verity Instruments, Inc.
- Andrew Weeks Kueny
- G01 - MEASURING TESTING
Information Patent Application
HIGH DYNAMIC RANGE MEASUREMENT SYSTEM FOR PROCESS MONITORING
- Publication number 20160316546
- Publication date Oct 27, 2016
- Verity Instruments, Inc.
- Larry Arlos Bullock
- G01 - MEASURING TESTING
Information Patent Application
REFERENCED AND STABILIZED OPTICAL MEASUREMENT SYSTEM
- Publication number 20130016343
- Publication date Jan 17, 2013
- John Douglas Corless
- G01 - MEASURING TESTING
Information Patent Application
Workpiece Characterization System
- Publication number 20120120387
- Publication date May 17, 2012
- Mark Anthony Meloni
- G01 - MEASURING TESTING
Information Patent Application
Workpiece Characterization System
- Publication number 20120025097
- Publication date Feb 2, 2012
- Mark Anthony Meloni
- G01 - MEASURING TESTING
Information Patent Application
Calibration of a radiometric optical monitoring system used for fau...
- Publication number 20090103081
- Publication date Apr 23, 2009
- Verity Instruments, Inc.
- Mike Whelan
- G01 - MEASURING TESTING

John Douglas Corless

Person

Patents Grantslast 30 patents

System, apparatus, and method for improved background correction an...

System, apparatus, and method for spectral filtering

Multimode configurable spectrometer

Fiberoptically-coupled measurement system with reduced sensitivity...

System and method for calibration of optical signals in semiconduct...

High dynamic range measurement system for process monitoring

Referenced and stabilized optical measurement system

Workpiece characterization system

High dynamic range measurement system for process monitoring

Calibration of a radiometric optical monitoring system used for fau...

Patents Applicationslast 30 patents

SYSTEM, APPARATUS, AND METHOD FOR IMPROVED BACKGROUND CORRECTION AN...

SYSTEM, APPARATUS, AND METHOD FOR SPECTRAL FILTERING

MULTIMODE CONFIGURABLE SPECTROMETER

FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY...

MULTIMODE CONFIGURABLE SPECTROMETER

SYSTEM AND METHOD FOR CALIBRATION OF OPTICAL SIGNALS IN SEMICONDUCT...

HIGH DYNAMIC RANGE MEASUREMENT SYSTEM FOR PROCESS MONITORING

REFERENCED AND STABILIZED OPTICAL MEASUREMENT SYSTEM

Workpiece Characterization System

Workpiece Characterization System

Calibration of a radiometric optical monitoring system used for fau...