John Dwinell

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Wrentham, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Image quality analysis with test pattern
- Patent number 8,139,117
- Issue date Mar 20, 2012
- Sick, Inc.
- John Dwinell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parcel dimensioning measurement system and method
- Patent number 8,132,728
- Issue date Mar 13, 2012
- Sick, Inc.
- John Dwinell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bar code scanning system and method
- Patent number 6,267,293
- Issue date Jul 31, 2001
- CiMatrix
- John F. Dwinell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Frequency division multiplexed bar code scanner
- Patent number 6,193,157
- Issue date Feb 27, 2001
- CiMatrix
- Karen M. Dickson
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Parcel dimensioning measurement system and method
- Publication number 20080245873
- Publication date Oct 9, 2008
- John Dwinell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image quality analysis with test pattern
- Publication number 20070285537
- Publication date Dec 13, 2007
- John Dwinell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Parcel imaging system and method
- Publication number 20070237356
- Publication date Oct 11, 2007
- John Dwinell
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
Scanning imaging system and method for imaging articles using same
- Publication number 20070103581
- Publication date May 10, 2007
- SICK, INC.
- John F Dwinell
- G06 - COMPUTING CALCULATING COUNTING