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John E. Heidenreich, III
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Yorktown Heights, NY, US
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last 30 patents
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Patent Grant
Copper to aluminum interlayer interconnect using stud and via liner
Patent number
7,087,997
Issue date
Aug 8, 2006
International Business Machines Corporation
Lloyd G. Burrell
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Copper to aluminum interlayer interconnect using stud and via liner
Patent number
7,037,824
Issue date
May 2, 2006
International Business Machines Corporation
Lloyd G. Burrell
H01 - BASIC ELECTRIC ELEMENTS