JOHN E. MACCRISKEN

Person

WATSONVILLE, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Simulation, measurement and/or control system and method with coord...
- Patent number 7,865,349
- Issue date Jan 4, 2011
- National Instruments Corporation
- Jeffrey L. Kodosky
- G05 - CONTROLLING REGULATING
Information Patent Grant
Parallel-beam scanning for surface patterning of materials
- Patent number 7,525,707
- Issue date Apr 28, 2009
- Semicube, Inc.
- Raymond M. Warner, Jr.
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Parallel-beam scanning for surface patterning of materials
- Patent number 7,371,596
- Issue date May 13, 2008
- Semicube, Inc.
- Raymond M. Warner, Jr.
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Graphical system for modelling a process and associated method
- Patent number 5,732,277
- Issue date Mar 24, 1998
- National Instruments Corporation
- Jeffrey L. Kodosky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical system for modelling a process and associated method
- Patent number 5,610,828
- Issue date Mar 11, 1997
- National Instruments Corporation
- Jeffrey L. Kodosky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Polymorphic dataflow block diagram system and method for programmin...
- Patent number 5,301,301
- Issue date Apr 5, 1994
- National Instruments Corporation
- Jeffrey L. Kodosky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical method for programming a virtual instrument
- Patent number 5,301,336
- Issue date Apr 5, 1994
- National Instruments, Inc.
- Jeffrey L. Kodosky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical system for executing a process and for programming a comp...
- Patent number 5,291,587
- Issue date Mar 1, 1994
- National Instruments, Inc.
- Jeffrey L. Kodosky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical system for modelling a process and associated method
- Patent number 4,914,568
- Issue date Apr 3, 1990
- National Instruments, Inc.
- Jeffrey L. Kodosky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical system for modelling a process and associated method
- Patent number 4,901,221
- Issue date Feb 13, 1990
- National Instruments, Inc.
- Jeffrey L. Kodosky
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Parallel-Beam Scanning for Surface Patterning of Materials
- Publication number 20080192316
- Publication date Aug 14, 2008
- Raymond M. Warner
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Parallel-beam scanning for surface patterning of materials
- Publication number 20060151449
- Publication date Jul 13, 2006
- Raymond M. Warner
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Simulation, measurement and/or control system and method with coord...
- Publication number 20020111783
- Publication date Aug 15, 2002
- Jeffrey L. Kodosky
- G05 - CONTROLLING REGULATING
Information Patent Application
MONOCRYSTALLINE THREE-DIMENSIONAL INTEGRATED-CIRCUIT TECHNOLOGY
- Publication number 20010002650
- Publication date Jun 7, 2001
- RAYMOND M. WARNER
- H01 - BASIC ELECTRIC ELEMENTS

JOHN E. MACCRISKEN

Person

Patents Grantslast 30 patents

Simulation, measurement and/or control system and method with coord...

Parallel-beam scanning for surface patterning of materials

Parallel-beam scanning for surface patterning of materials

Graphical system for modelling a process and associated method

Graphical system for modelling a process and associated method

Polymorphic dataflow block diagram system and method for programmin...

Graphical method for programming a virtual instrument

Graphical system for executing a process and for programming a comp...

Graphical system for modelling a process and associated method

Graphical system for modelling a process and associated method

Patents Applicationslast 30 patents

Parallel-Beam Scanning for Surface Patterning of Materials

Parallel-beam scanning for surface patterning of materials

Simulation, measurement and/or control system and method with coord...

MONOCRYSTALLINE THREE-DIMENSIONAL INTEGRATED-CIRCUIT TECHNOLOGY