John E. P. Syka

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Ion source assembly for an ion trap mass spectrometer and method
- Patent number 5,756,996
- Issue date May 26, 1998
- Finnigan Corporation
- Mark E. Bier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer system and method
- Patent number 5,420,425
- Issue date May 30, 1995
- Finnigan Corporation
- Mark E. Bier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating an ion trap mass spectrometer in a high resolut...
- Patent number 5,182,451
- Issue date Jan 26, 1993
- Finnigan Corporation
- Jae C. Schwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating ion trap detector in MS/MS mode
- Patent number RE34000
- Issue date Jul 21, 1992
- Finnigan Corporation
- John E. P. Syka
- 250 - Radiant energy
Information Patent Grant
Method and apparatus for mass analysis in a multipole mass spectrom...
- Patent number 5,089,703
- Issue date Feb 18, 1992
- Finnigan Corporation
- Alan E. Schoen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of increasing the dynamic range and sensitivity of a quadrup...
- Patent number 4,771,172
- Issue date Sep 13, 1988
- Finnigan Corporation
- Michael Weber-Grabau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fourtier transform quadrupole mass spectrometer and method
- Patent number 4,755,670
- Issue date Jul 5, 1988
- Finnigan Corporation
- John E. P. Syka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of isolating a single mass in a quadrupole ion trap
- Patent number 4,749,860
- Issue date Jun 7, 1988
- Finnigan Corporation
- Paul E. Kelley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating ion trap detector in MS/MS mode
- Patent number 4,736,101
- Issue date Apr 5, 1988
- Finnigan Corporation
- John E. P. Syka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating quadrupole ion trap chemical ionization mass sp...
- Patent number 4,686,367
- Issue date Aug 11, 1987
- Finnigan Corporation
- John N. Louris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of mass analyzing a sample over a wide mass range by use of...
- Patent number 4,650,999
- Issue date Mar 17, 1987
- Finnigan Corporation
- William J. Fies
- H01 - BASIC ELECTRIC ELEMENTS

John E. P. Syka

Person

Patents Grantslast 30 patents

Ion source assembly for an ion trap mass spectrometer and method

Ion trap mass spectrometer system and method

Method of operating an ion trap mass spectrometer in a high resolut...

Method of operating ion trap detector in MS/MS mode

Method and apparatus for mass analysis in a multipole mass spectrom...

Method of increasing the dynamic range and sensitivity of a quadrup...

Fourtier transform quadrupole mass spectrometer and method

Method of isolating a single mass in a quadrupole ion trap

Method of operating ion trap detector in MS/MS mode

Method of operating quadrupole ion trap chemical ionization mass sp...

Method of mass analyzing a sample over a wide mass range by use of...