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John E. Siefers
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Loveland, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
X-tree test method and apparatus in a multiplexed digital system
Patent number
7,127,652
Issue date
Oct 24, 2006
Agilent Technologies, Inc.
Dayton Norrgard
G01 - MEASURING TESTING
Information
Patent Grant
Adapter method and apparatus for interfacing a tester with a device...
Patent number
7,009,381
Issue date
Mar 7, 2006
Agilent Technologies, Inc.
Chris R. Jacobsen
G01 - MEASURING TESTING
Information
Patent Grant
Connector cable and method for probing vacuum-sealable electronic n...
Patent number
6,894,479
Issue date
May 17, 2005
Agilent Technologies, Inc.
John E. Siefers
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board coupon tester
Patent number
6,828,778
Issue date
Dec 7, 2004
Agilent Technologies, Inc.
Chris R Jacobsen
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting the connectivity of electrical conductors duri...
Patent number
6,801,863
Issue date
Oct 5, 2004
Agilent Technologies, Inc.
Stephen Hird
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board coupon tester
Patent number
6,664,778
Issue date
Dec 16, 2003
Agilent Technologies, Inc.
Chris R Jacobsen
G01 - MEASURING TESTING
Information
Patent Grant
General purpose, reconfigurable system for processing serial bit st...
Patent number
5,243,273
Issue date
Sep 7, 1993
Hewlett-Packard Company
Robert E. McAuliffe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
General purpose, reconfigurable system for processing serial bit st...
Patent number
5,150,048
Issue date
Sep 22, 1992
Hewlett-Packard Company
Robert E. McAuliffe
G01 - MEASURING TESTING
Information
Patent Grant
Serial data frame generator for testing telecommunications circuits
Patent number
4,967,412
Issue date
Oct 30, 1990
Hewlett-Packard Company
Christopher B. Cain
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Apparatus and method for isolating and connecting two electrical ci...
Patent number
4,912,403
Issue date
Mar 27, 1990
Hewlett-Packard Company
John E. Siefers
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for isolating and connecting two electrical ci...
Patent number
4,849,691
Issue date
Jul 18, 1989
Hewlett-Packard Company
John E. Siefers
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-Tree test method and apparatus in a multiplexed digital system
Publication number
20040250190
Publication date
Dec 9, 2004
Dayton Norrgard
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING THE CONNECTIVITY OF ELECTRICAL CONDUCTORS DURI...
Publication number
20040181348
Publication date
Sep 16, 2004
Stephen Hird
G01 - MEASURING TESTING
Information
Patent Application
Adapter method and apparatus for interfacing a tester with a device...
Publication number
20040108848
Publication date
Jun 10, 2004
Chris R. Jacobsen
G01 - MEASURING TESTING
Information
Patent Application
Circuit board coupon tester
Publication number
20040080310
Publication date
Apr 29, 2004
Chris R. Jacobsen
G01 - MEASURING TESTING
Information
Patent Application
Connector cable and method for probing vacuum-sealable electronic n...
Publication number
20040036465
Publication date
Feb 26, 2004
John E. Siefers
G01 - MEASURING TESTING
Information
Patent Application
Circuit board coupon tester
Publication number
20020175672
Publication date
Nov 28, 2002
Chris R. Jacobsen
G01 - MEASURING TESTING