John E. Spittal, Jr.

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Waddel, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for secure scan testing
- Patent number 7,725,788
- Issue date May 25, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Thomas Tkacik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for secure scan testing
- Patent number 7,185,249
- Issue date Feb 27, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Thomas Tkacik
- G06 - COMPUTING CALCULATING COUNTING