John F. Donaldson

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Thousand Oaks, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Memory tester with data compression
- Patent number 6,360,340
- Issue date Mar 19, 2002
- Teradyne, Inc.
- Benjamin J. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor tester for testing devices with embedded memory
- Patent number 5,923,675
- Issue date Jul 13, 1999
- Teradyne, Inc.
- Benjamin J. Brown
- G11 - INFORMATION STORAGE