John F. Flanagan IV

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Artificial intelligence-enabled preparation end-pointing
- Patent number 11,847,813
- Issue date Dec 19, 2023
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parameter estimation for metrology of features in an image
- Patent number 11,569,056
- Issue date Jan 31, 2023
- FEI Company
- Brad Larson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for automatic zone axis alignment
- Patent number 11,211,222
- Issue date Dec 28, 2021
- FEI Company
- John J. Flanagan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Artificial intelligence-enabled preparation end-pointing
- Patent number 11,176,656
- Issue date Nov 16, 2021
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using convolution neural networks for on-the-fly single particle re...
- Patent number 11,151,356
- Issue date Oct 19, 2021
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for orienting a sample using a diffraction pattern
- Patent number 9,978,557
- Issue date May 22, 2018
- FEI Company
- John Francis Flanagan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FEW-SHOT LEARNING FOR PROCESSING MICROSCOPY IMAGES
- Publication number 20240354924
- Publication date Oct 24, 2024
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20240071040
- Publication date Feb 29, 2024
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Selection And Model Training For Charged Particle Microsc...
- Publication number 20240071051
- Publication date Feb 29, 2024
- FEI Company
- John Francis Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CRITICAL DIMENSION MEASUREMENT IN 3D WITH GEOMETRIC MODELS
- Publication number 20230245334
- Publication date Aug 3, 2023
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Artificial Intelligence Enabled Metrology
- Publication number 20230034667
- Publication date Feb 2, 2023
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Sample Alignment For Microscopy
- Publication number 20230020742
- Publication date Jan 19, 2023
- FEI Company
- John FLANAGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT
- Publication number 20220076917
- Publication date Mar 10, 2022
- FEI Company
- John J. FLANAGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20220067915
- Publication date Mar 3, 2022
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT
- Publication number 20210202205
- Publication date Jul 1, 2021
- FEI Company
- John J. FLANAGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSE ESTIMATION USING SEMATIC SEGMENTATION
- Publication number 20210088770
- Publication date Mar 25, 2021
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20200279362
- Publication date Sep 3, 2020
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING CONVOLUTION NEURAL NETWORKS FOR ON-THE-FLY SINGLE PARTICLE RE...
- Publication number 20200272805
- Publication date Aug 27, 2020
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARAMETER ESTIMATION FOR METROLOGY OF FEATURES IN AN IMAGE
- Publication number 20200161083
- Publication date May 21, 2020
- FEI Company
- Brad LARSON
- G01 - MEASURING TESTING
Information Patent Application
Artificial Intelligence Enabled Metrology
- Publication number 20200134829
- Publication date Apr 30, 2020
- FEI Company
- John FLANAGAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR ORIENTING A SAMPLE USING A DIFFRACTION PATTERN
- Publication number 20170309441
- Publication date Oct 26, 2017
- FEI Company
- John F. Flanagan
- H01 - BASIC ELECTRIC ELEMENTS

John F. Flanagan IV

Person

Patents Grantslast 30 patents

Artificial intelligence-enabled preparation end-pointing

Parameter estimation for metrology of features in an image

Method and system for automatic zone axis alignment

Artificial intelligence-enabled preparation end-pointing

Using convolution neural networks for on-the-fly single particle re...

System for orienting a sample using a diffraction pattern

Patents Applicationslast 30 patents

FEW-SHOT LEARNING FOR PROCESSING MICROSCOPY IMAGES

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

Automated Selection And Model Training For Charged Particle Microsc...

CRITICAL DIMENSION MEASUREMENT IN 3D WITH GEOMETRIC MODELS

Artificial Intelligence Enabled Metrology

Automated Sample Alignment For Microscopy

METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT

POSE ESTIMATION USING SEMATIC SEGMENTATION

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

USING CONVOLUTION NEURAL NETWORKS FOR ON-THE-FLY SINGLE PARTICLE RE...

PARAMETER ESTIMATION FOR METROLOGY OF FEATURES IN AN IMAGE

Artificial Intelligence Enabled Metrology

SYSTEM FOR ORIENTING A SAMPLE USING A DIFFRACTION PATTERN