John F. Hagios

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Williston, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of fabricating a compliant membrane probe
- Patent number 8,640,324
- Issue date Feb 4, 2014
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Compliant membrane thin film interposer probe for intergrated circu...
- Patent number 7,688,089
- Issue date Mar 30, 2010
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 7,084,651
- Issue date Aug 1, 2006
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test space transformer
- Patent number 6,967,557
- Issue date Nov 22, 2005
- International Business Machines Corporation
- John F. Hagios
- G01 - MEASURING TESTING
Information Patent Grant
Method for wafer test and wafer test system for implementing the me...
- Patent number 6,720,789
- Issue date Apr 13, 2004
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPLIANT MEMBRANE THIN FILM INTERPOSER PROBE FOR INTEGRATED CIRCUI...
- Publication number 20100083496
- Publication date Apr 8, 2010
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
COMPLIANT MEMBRANE PROBE
- Publication number 20090189620
- Publication date Jul 30, 2009
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ASSEMBLY
- Publication number 20060022685
- Publication date Feb 2, 2006
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SPACE TRANSFORMER
- Publication number 20050046537
- Publication date Mar 3, 2005
- International Business Machines Corporation
- John F. Hagios
- G01 - MEASURING TESTING