John Fjeldsted

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fast method for measuring collision cross section of ions utilizing...
- Patent number 9,482,642
- Issue date Nov 1, 2016
- Agilent Technologies, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for enhancing resolution of mass spectra
- Patent number 7,908,093
- Issue date Mar 15, 2011
- Agilent Technologies, Inc.
- John Christian Fjeldsted
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced resolution mass spectrometer and mass spectrometry method
- Patent number 7,863,556
- Issue date Jan 4, 2011
- Agilent Technologies, Inc.
- August Hidalgo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for dynamically adjusting sampling rates of mas...
- Patent number 7,684,932
- Issue date Mar 23, 2010
- Agilent Technologies, Inc.
- August Jon Hidalgo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for enhancing dynamic range
- Patent number 7,423,259
- Issue date Sep 9, 2008
- Agilent Technologies, Inc.
- August Jon Hidalgo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for enhancing resolution of mass spectra
- Patent number 7,412,334
- Issue date Aug 12, 2008
- Agilent Technologies, Inc.
- John Christian Fjeldsted
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Molecular activation for tandem mass spectroscopy
- Patent number 7,385,185
- Issue date Jun 10, 2008
- Agilent Technologies, Inc.
- Jerry T. Dowell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of comparative analysis using ion trap mass spectrometers
- Patent number 5,903,003
- Issue date May 11, 1999
- Bruker Daltonik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quartz quadrupole for mass filter
- Patent number 4,885,500
- Issue date Dec 5, 1989
- Hewlett-Packard Company
- Stuart Hansen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heating system for GC/MS instruments
- Patent number 4,804,839
- Issue date Feb 14, 1989
- Hewlett-Packard Company
- Carolyn C. Broadbent
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAST METHOD FOR MEASURING COLLISION CROSS SECTION OF IONS UTILIZING...
- Publication number 20150219598
- Publication date Aug 6, 2015
- Agilent Technologies, Inc.
- Alexander Mordehai
- G01 - MEASURING TESTING
Information Patent Application
Enhanced Resolution Mass Spectrometer and Mass Spectrometry Method
- Publication number 20110210240
- Publication date Sep 1, 2011
- August Hidalgo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Enhanced Resolution Mass Spectrometer and Mass Spectrometry Method
- Publication number 20090020697
- Publication date Jan 22, 2009
- August Hidalgo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Method for Enhancing Resolution of Mass Spectra
- Publication number 20080300800
- Publication date Dec 4, 2008
- John Christian Fjeldsted
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and methods for dynamically adjusting sampling rates of mas...
- Publication number 20080040050
- Publication date Feb 14, 2008
- August Jon Hidalgo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer and method for enhancing dynamic range
- Publication number 20070268171
- Publication date Nov 22, 2007
- August Jon Hidalgo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Mass spectrometer and method for enhancing resolution of mass spectra
- Publication number 20070255532
- Publication date Nov 1, 2007
- John Christian Fjeldsted
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Molecular activation for tandem mass spectroscopy
- Publication number 20070138383
- Publication date Jun 21, 2007
- Jerry T. Dowell
- H01 - BASIC ELECTRIC ELEMENTS

John Fjeldsted

Person

Patents Grantslast 30 patents

Fast method for measuring collision cross section of ions utilizing...

Mass spectrometer and method for enhancing resolution of mass spectra

Enhanced resolution mass spectrometer and mass spectrometry method

Systems and methods for dynamically adjusting sampling rates of mas...

Mass spectrometer and method for enhancing dynamic range

Mass spectrometer and method for enhancing resolution of mass spectra

Molecular activation for tandem mass spectroscopy

Methods of comparative analysis using ion trap mass spectrometers

Quartz quadrupole for mass filter

Heating system for GC/MS instruments

Patents Applicationslast 30 patents

FAST METHOD FOR MEASURING COLLISION CROSS SECTION OF IONS UTILIZING...

Enhanced Resolution Mass Spectrometer and Mass Spectrometry Method

Enhanced Resolution Mass Spectrometer and Mass Spectrometry Method

Mass Spectrometer and Method for Enhancing Resolution of Mass Spectra

Systems and methods for dynamically adjusting sampling rates of mas...

Mass spectrometer and method for enhancing dynamic range

Mass spectrometer and method for enhancing resolution of mass spectra

Molecular activation for tandem mass spectroscopy