JOHN GERLING

Person

Lafayette, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Segmented multi-channel, backside illuminated, solid state detector...
- Patent number 11,699,607
- Issue date Jul 11, 2023
- KLA Corporation
- John Gerling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection and review using transmissive current image of ch...
- Patent number 11,410,830
- Issue date Aug 9, 2022
- KLA Corporation
- Hong Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-column scanning electron microscopy system
- Patent number 10,840,056
- Issue date Nov 17, 2020
- KLA Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array-based characterization tool
- Patent number 10,438,769
- Issue date Oct 8, 2019
- KLA-Tencor Corporation
- Alex Lipkind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-column scanning electron microscopy system
- Patent number 10,354,832
- Issue date Jul 16, 2019
- KLA-Tencor Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Permanent-magnet particle beam apparatus and method incorporating a...
- Patent number 10,211,021
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Tomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for fine-tuning magnet arrays with localized e...
- Patent number 9,779,872
- Issue date Oct 3, 2017
- KLA-Tencor Corporation
- John Gerling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High density solid state light source array
- Patent number 9,754,807
- Issue date Sep 5, 2017
- Applied Materials, Inc.
- John Gerling
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for providing and directing heat energy in a process chamber
- Patent number 9,543,172
- Issue date Jan 10, 2017
- Applied Materials, Inc.
- Joseph Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for optical inspection, magnetic field and hei...
- Patent number 9,513,230
- Issue date Dec 6, 2016
- KLA-Tencor Corporation
- John Gerling
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Asymmetrical detector design and methodology
- Patent number 9,418,819
- Issue date Aug 16, 2016
- KLA-Tencor Corporation
- John Gerling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-invasive charged particle beam monitor
- Patent number 9,390,887
- Issue date Jul 12, 2016
- KLA-Tencor Corporation
- Thomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid state light source assisted processing
- Patent number 9,232,569
- Issue date Jan 5, 2016
- Applied Materials, Inc.
- Joseph Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
MINIATURE ELECTRON OPTICAL COLUMN WITH A LARGE FIELD OF VIEW
- Publication number 20240014000
- Publication date Jan 11, 2024
- Alan D. Brodie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MINIATURE HYBRID ELECTRON BEAM COLUMN
- Publication number 20230326704
- Publication date Oct 12, 2023
- KLA Corporation
- Lawrence Muray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEGMENTED MULTI-CHANNEL, BACKSIDE ILLUMINATED, SOLID STATE DETECTOR...
- Publication number 20220399220
- Publication date Dec 15, 2022
- KLA Corporation
- John Gerling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-COLUMN SCANNING ELECTRON MICROSCOPY SYSTEM
- Publication number 20210090844
- Publication date Mar 25, 2021
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Column Scanning Electron Microscopy System
- Publication number 20180358200
- Publication date Dec 13, 2018
- KLA-Tencor Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Column Scanning Electron Microscopy System
- Publication number 20180226219
- Publication date Aug 9, 2018
- KLA-Tencor Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PERMANENT-MAGNET PARTICLE BEAM APPARATUS AND METHOD INCORPORATING A...
- Publication number 20170294286
- Publication date Oct 12, 2017
- KLA-Tencor Corporation
- Tomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR FINE-TUNING MAGNET ARRAYS WITH LOCALIZED E...
- Publication number 20150179327
- Publication date Jun 25, 2015
- KLA-Tencor Corporation
- John GERLING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-INVASIVE CHARGED PARTICLE BEAM MONITOR
- Publication number 20150076350
- Publication date Mar 19, 2015
- KLA-Tencor Corporation
- Thomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUMMY BARRIER LAYER FEATURES FOR PATTERNING OF SPARSELY DISTRIBUTED...
- Publication number 20150076697
- Publication date Mar 19, 2015
- KLA-Tencor Corporation
- Tomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASYMMETRICAL DETECTOR DESIGN AND METHODOLOGY
- Publication number 20150069234
- Publication date Mar 12, 2015
- KLA-Tencor Corporation
- John Gerling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL MANAGEMENT APPARATUS FOR SOLID STATE LIGHT SOURCE ARRAYS
- Publication number 20140270731
- Publication date Sep 18, 2014
- Applied Materials, Inc.
- JOHN GERLING
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HIGH DENSITY SOLID STATE LIGHT SOURCE ARRAY
- Publication number 20140270735
- Publication date Sep 18, 2014
- Applied Materials, Inc.
- JOHN GERLING
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SOLID STATE LIGHT SOURCE ASSISTED PROCESSING
- Publication number 20140238970
- Publication date Aug 28, 2014
- Applied Materials, Inc.
- JOSEPH JOHNSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR OPTICAL INSPECTION, MAGNETIC FIELD AND HEI...
- Publication number 20140218503
- Publication date Aug 7, 2014
- KLA-Tencor Corporation
- John Gerling
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR PROVIDING AND DIRECTING HEAT ENERGY IN A PROCESS CHAMBER
- Publication number 20140105583
- Publication date Apr 17, 2014
- Applied Materials, Inc.
- JOSEPH JOHNSON
- H01 - BASIC ELECTRIC ELEMENTS

JOHN GERLING

Person

Patents Grantslast 30 patents

Segmented multi-channel, backside illuminated, solid state detector...

Defect inspection and review using transmissive current image of ch...

Multi-column scanning electron microscopy system

Array-based characterization tool

Multi-column scanning electron microscopy system

Permanent-magnet particle beam apparatus and method incorporating a...

Apparatus and method for fine-tuning magnet arrays with localized e...

High density solid state light source array

Apparatus for providing and directing heat energy in a process chamber

Apparatus and method for optical inspection, magnetic field and hei...

Asymmetrical detector design and methodology

Non-invasive charged particle beam monitor

Solid state light source assisted processing

Patents Applicationslast 30 patents

MINIATURE ELECTRON OPTICAL COLUMN WITH A LARGE FIELD OF VIEW

MINIATURE HYBRID ELECTRON BEAM COLUMN

SEGMENTED MULTI-CHANNEL, BACKSIDE ILLUMINATED, SOLID STATE DETECTOR...

MULTI-COLUMN SCANNING ELECTRON MICROSCOPY SYSTEM

Multi-Column Scanning Electron Microscopy System

Multi-Column Scanning Electron Microscopy System

PERMANENT-MAGNET PARTICLE BEAM APPARATUS AND METHOD INCORPORATING A...

APPARATUS AND METHOD FOR FINE-TUNING MAGNET ARRAYS WITH LOCALIZED E...

NON-INVASIVE CHARGED PARTICLE BEAM MONITOR

DUMMY BARRIER LAYER FEATURES FOR PATTERNING OF SPARSELY DISTRIBUTED...

ASYMMETRICAL DETECTOR DESIGN AND METHODOLOGY

THERMAL MANAGEMENT APPARATUS FOR SOLID STATE LIGHT SOURCE ARRAYS

HIGH DENSITY SOLID STATE LIGHT SOURCE ARRAY

SOLID STATE LIGHT SOURCE ASSISTED PROCESSING

APPARATUS AND METHOD FOR OPTICAL INSPECTION, MAGNETIC FIELD AND HEI...

APPARATUS FOR PROVIDING AND DIRECTING HEAT ENERGY IN A PROCESS CHAMBER