John Greg Massey

Person

Jericho, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Back-end-of-line compatible metal-insulator-metal on-chip decouplin...
- Patent number 11,594,596
- Issue date Feb 28, 2023
- International Business Machines Corporation
- Paul Jamison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quad-layer high-k for metal-insulator-metal capacitors
- Patent number 11,309,383
- Issue date Apr 19, 2022
- International Business Machines Corporation
- Kisik Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 11,054,459
- Issue date Jul 6, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Back-end-of-line compatible metal-insulator-metal on-chip decouplin...
- Patent number 11,038,013
- Issue date Jun 15, 2021
- International Business Machines Corporation
- Paul Jamison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,996,259
- Issue date May 4, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,989,754
- Issue date Apr 27, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Real time X-ray dosimeter using diodes with variable thickness degr...
- Patent number 10,634,797
- Issue date Apr 28, 2020
- International Business Machines Corporation
- Michael S. Gordon
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Real time X-ray dosimeter using diodes with variable thickness degr...
- Patent number 10,627,529
- Issue date Apr 21, 2020
- International Business Machines Corporation
- Michael S. Gordon
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,564,214
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,739,824
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,395,403
- Issue date Jul 19, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Error protection for a data bus
- Patent number 9,201,727
- Issue date Dec 1, 2015
- International Business Machines Corporation
- William V. Huott
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Error protection for integrated circuits
- Patent number 9,043,683
- Issue date May 26, 2015
- International Business Machines Corporation
- William V. Huott
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Placement of storage cells on an integrated circuit
- Patent number 9,041,428
- Issue date May 26, 2015
- International Business Machines Corporation
- William V. Huott
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Shared error protection for register banks
- Patent number 9,021,328
- Issue date Apr 28, 2015
- International Business Machines Corporation
- William V. Huott
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Radiation hardened memory cell and design structures
- Patent number 9,006,827
- Issue date Apr 14, 2015
- International Business Machines Corporation
- John G. Massey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement methodology and array structure for statistical stress...
- Patent number 8,120,356
- Issue date Feb 21, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Array-based early threshold voltage recovery characterization measu...
- Patent number 7,868,640
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Kanak B Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method for thermally stressing or testing a semicondu...
- Patent number 7,375,371
- Issue date May 20, 2008
- International Business Machines Corporation
- Giuseppe La Rosa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADAPTIVE FILL TECHNIQUES FOR AVOIDING ELECTROMIGRATION
- Publication number 20230238280
- Publication date Jul 27, 2023
- International Business Machines Corporation
- Akil Khamisi Sutton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMALLY COUPLED AWARE DEVICE PLACEMENT
- Publication number 20230214573
- Publication date Jul 6, 2023
- International Business Machines Corporation
- Akil Khamisi Sutton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BACK-END-OF-LINE COMPATIBLE METAL-INSULATOR-METAL ON-CHIP DECOUPLIN...
- Publication number 20210193793
- Publication date Jun 24, 2021
- International Business Machines Corporation
- Paul Jamison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACK-END-OF-LINE COMPATIBLE METAL-INSULATOR-METAL ON-CHIP DECOUPLIN...
- Publication number 20210028274
- Publication date Jan 28, 2021
- International Business Machines Corporation
- Paul Jamison
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200141996
- Publication date May 7, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200072897
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
REAL TIME X-RAY DOSIMETER USING DIODES WITH VARIABLE THICKNESS DEGR...
- Publication number 20190011572
- Publication date Jan 10, 2019
- International Business Machines Corporation
- Michael S. Gordon
- G01 - MEASURING TESTING
Information Patent Application
REAL TIME X-RAY DOSIMETER USING DIODES WITH VARIABLE THICKNESS DEGR...
- Publication number 20190011573
- Publication date Jan 10, 2019
- International Business Machines Corporation
- Michael S. Gordon
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20180074114
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20170285094
- Publication date Oct 5, 2017
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20160258994
- Publication date Sep 8, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20150115994
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
ERROR PROTECTION FOR INTEGRATED CIRCUITS
- Publication number 20140208184
- Publication date Jul 24, 2014
- International Business Machines Corporation
- William V. Huott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHARED ERROR PROTECTION FOR REGISTER BANKS
- Publication number 20140201589
- Publication date Jul 17, 2014
- International Business Machines Corporation
- William V. Huott
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ERROR PROTECTION FOR INTEGRATED CIRCUITS IN AN INSENSITIVE DIRECTION
- Publication number 20140201599
- Publication date Jul 17, 2014
- International Business Machines Corporation
- Kevin W. Kark
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PLACEMENT OF STORAGE CELLS ON AN INTEGRATED CIRCUIT
- Publication number 20140197863
- Publication date Jul 17, 2014
- International Business Machines Corporation
- William V. Huott
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ERROR PROTECTION FOR A DATA BUS
- Publication number 20140201606
- Publication date Jul 17, 2014
- International Business Machines Corporation
- William V. Huott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION HARDENED MEMORY CELL AND DESIGN STRUCTURES
- Publication number 20130113043
- Publication date May 9, 2013
- International Business Machines Corporation
- John G. MASSEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT CHIP INCORPORATING A TEST CIRCUIT THAT ALLOWS FO...
- Publication number 20120259575
- Publication date Oct 11, 2012
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHODOLOGY AND ARRAY STRUCTURE FOR STATISTICAL STRESS...
- Publication number 20100318313
- Publication date Dec 16, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
Array-Based Early Threshold Voltage Recovery Characterization Measu...
- Publication number 20090251167
- Publication date Oct 8, 2009
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD FOR THERMALLY STRESSING OR TESTING A SEMICONDU...
- Publication number 20070235769
- Publication date Oct 11, 2007
- International Business Machines Corporation
- Giuseppe La Rosa
- G01 - MEASURING TESTING

John Greg Massey

Person

Patents Grantslast 30 patents

Back-end-of-line compatible metal-insulator-metal on-chip decouplin...

Quad-layer high-k for metal-insulator-metal capacitors

Optimization of integrated circuit reliability

Back-end-of-line compatible metal-insulator-metal on-chip decouplin...

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Real time X-ray dosimeter using diodes with variable thickness degr...

Real time X-ray dosimeter using diodes with variable thickness degr...

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Error protection for a data bus

Error protection for integrated circuits

Placement of storage cells on an integrated circuit

Shared error protection for register banks

Radiation hardened memory cell and design structures

Measurement methodology and array structure for statistical stress...

Array-based early threshold voltage recovery characterization measu...

Structure and method for thermally stressing or testing a semicondu...

Patents Applicationslast 30 patents

ADAPTIVE FILL TECHNIQUES FOR AVOIDING ELECTROMIGRATION

THERMALLY COUPLED AWARE DEVICE PLACEMENT

BACK-END-OF-LINE COMPATIBLE METAL-INSULATOR-METAL ON-CHIP DECOUPLIN...

BACK-END-OF-LINE COMPATIBLE METAL-INSULATOR-METAL ON-CHIP DECOUPLIN...

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

REAL TIME X-RAY DOSIMETER USING DIODES WITH VARIABLE THICKNESS DEGR...

REAL TIME X-RAY DOSIMETER USING DIODES WITH VARIABLE THICKNESS DEGR...

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

ERROR PROTECTION FOR INTEGRATED CIRCUITS

SHARED ERROR PROTECTION FOR REGISTER BANKS

ERROR PROTECTION FOR INTEGRATED CIRCUITS IN AN INSENSITIVE DIRECTION

PLACEMENT OF STORAGE CELLS ON AN INTEGRATED CIRCUIT

ERROR PROTECTION FOR A DATA BUS

RADIATION HARDENED MEMORY CELL AND DESIGN STRUCTURES

INTEGRATED CIRCUIT CHIP INCORPORATING A TEST CIRCUIT THAT ALLOWS FO...

MEASUREMENT METHODOLOGY AND ARRAY STRUCTURE FOR STATISTICAL STRESS...

Array-Based Early Threshold Voltage Recovery Characterization Measu...

STRUCTURE AND METHOD FOR THERMALLY STRESSING OR TESTING A SEMICONDU...