Scotia, NY, US
Information
Patent Grant
X-Ray Optical Systems, Inc.
John H. Burdett, Jr.
D24 - Medical and laboratory equipment
Information
Patent Grant
X-Ray Optical Systems, Inc.
John H. Burdett, Jr.
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-Ray Optical Systems, Inc.
John H. Burdett, Jr.
G01 - MEASURING TESTING
Information
Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-Ray Optical Systems, Inc.
David M. Gibson
G01 - MEASURING TESTING
Information
Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-Ray Optical Systems, Inc.
Michael D. Moore
G01 - MEASURING TESTING
Information
Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Grant
X-Ray Optical Systems Incorporated
Thomas J. Bievenue
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
X-Ray Optical Systems, Inc.
John H. BURDETT, JR.
B82 - NANO-TECHNOLOGY
Information
Patent Application
X-Ray Optical Systems, Inc.
John H. BURDETT, JR.
G01 - MEASURING TESTING
