Scotia, NY, US
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X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Steven M. Pomerantz
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Patent Grant
X-Ray Optical Systems, Inc.
George Allen
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Zewu Chen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Grant
X-Ray Optical Systems, Inc.
Steven M. Pomerantz
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Zewu Chen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Grant
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Thomas J. Bievenue
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Steven M. POMERANTZ
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
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Patent Application
Steven M. Pomerantz
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
George ALLEN
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Michael D. Moore
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
David M. Gibson
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Thomas J. Bievenue
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
