John Heon Yi

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Burn-in using system-level test hardware
- Patent number 7,519,880
- Issue date Apr 14, 2009
- Advanced Micro Devices, Inc.
- Trent William Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Processor IC performance metric
- Patent number 6,365,859
- Issue date Apr 2, 2002
- Advanced Micro Devices
- John Yi
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING

Patents Applicationslast 30 patents

Information Patent Application
Semi-automated multi-site system tester
- Publication number 20030060996
- Publication date Mar 27, 2003
- John Yi
- G01 - MEASURING TESTING
Information Patent Application
Grooved/trenched lid for temperature measurements
- Publication number 20020075937
- Publication date Jun 20, 2002
- Advanced Mirco Devices
- John Heon Yi
- G01 - MEASURING TESTING