John Howells

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Redmond, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting defects along the edge of electr...
- Patent number 6,816,251
- Issue date Nov 9, 2004
- Daitron, Inc.
- Alan J. Swan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects along the edge of electr...
- Patent number 6,566,673
- Issue date May 20, 2003
- Daitron Inc.
- Alan Swan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects along the edge of electr...
- Patent number 6,545,752
- Issue date Apr 8, 2003
- Daitron, Inc.
- Alan J. Swan
- G01 - MEASURING TESTING
Information Patent Grant
Wafer handling system and method
- Patent number 6,183,186
- Issue date Feb 6, 2001
- Daitron, Inc.
- John Howells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer cassette rotation mechanism
- Patent number 6,152,680
- Issue date Nov 28, 2000
- Daitron, Inc.
- John Howells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Water slide for transferring semiconductor wafers
- Patent number 6,053,668
- Issue date Apr 25, 2000
- Daitron, Inc.
- Andrew P. Gorman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer transfer method and apparatus
- Patent number 5,915,910
- Issue date Jun 29, 1999
- Daitron, Inc.
- John Howells
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for detecting defects along the edge of electr...
- Publication number 20030030795
- Publication date Feb 13, 2003
- Daitron, Inc.
- Alan J. Swan
- G01 - MEASURING TESTING